Stub minimization using duplicate sets of signal terminals

ABSTRACT

A microelectronic structure has active elements defining a storage array, and address inputs for receipt of address information specifying locations within the storage array. The structure has a first surface and can have terminals exposed at the first surface. The terminals may include first terminals and the structure may be configured to transfer address information received at the first terminals to the address inputs. Each first terminal can have a signal assignment which includes one or more of the address inputs. The first terminals are disposed on first and second opposite sides of a theoretical plane normal to the first surface, wherein the signal assignments of the first terminals disposed on the first side are a mirror image of the signal assignments of the first terminals disposed on the second side of the theoretical plane.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application is a continuation-in-part of U.S. application Ser. Nos.13/439,317, 13/439,273, and 13/439,228; 13/440,212, 13/440,199, and13/439,280; 13/337,565 and 13/337,575; 13/440,515; 13/354,772 and13/354,747 and is a nonprovisional application of, and claims thebenefit of the filing dates of U.S. Provisional Application Nos.61/600,483; and 61/600,527 each filed Feb. 17, 2012. This applicationalso claims the benefit of the filing dates of U.S. ProvisionalApplication Nos. 61/542,488, 61/542,495, and 61/542,553, all filed Oct.3, 2011. The disclosures of all said prior applications are incorporatedherein by reference.

BACKGROUND OF THE INVENTION

The subject matter of the present application relates to microelectronicstructures, e.g., structures incorporating active circuit elements, suchas, without limitation, structures including at least one semiconductorchip or portion of at least one semiconductor chip, as well asassemblies incorporating microelectronic structures.

Semiconductor chips are commonly provided as individual, prepackagedunits. A standard chip has a flat, rectangular body with a large frontface having contacts connected to the internal circuitry of the chip.Each individual chip typically is contained in a package having externalterminals connected to the contacts of the chip. In turn, the terminals,i.e., the external connection points of the package, are configured toelectrically connect to a circuit panel, such as a printed circuitboard. In many conventional designs, the chip package occupies an areaof the circuit panel considerably larger than the area of the chipitself. As used in this disclosure with reference to a flat chip havinga front face, the “area of the chip” should be understood as referringto the area of the front face.

Size is a significant consideration in any physical arrangement ofchips. The demand for more compact physical arrangements of chips hasbecome even more intense with the rapid progress of portable electronicdevices. Merely by way of example, devices commonly referred to as“smart phones” integrate the functions of a cellular telephone withpowerful data processors, memory and ancillary devices such as globalpositioning system receivers, electronic cameras, and local area networkconnections along with high-resolution displays and associated imageprocessing chips. Such devices can provide capabilities such as fullinternet connectivity, entertainment including full-resolution video,navigation, electronic banking and more, all in a pocket-size device.Complex portable devices require packing numerous chips into a smallspace. Moreover, some of the chips have many input and outputconnections, commonly referred to as “I/Os.” These I/Os must beinterconnected with the I/Os of other chips. The components which formthe interconnections should not greatly increase the size of theassembly. Similar needs arise in other applications as, for example, indata servers such as those used in internet search engines whereincreased performance and size reduction are needed.

Microelectronic elements such as semiconductor chips which containmemory storage arrays, particularly dynamic random access memory chips(DRAMs) and flash memory chips, are commonly packaged in single- ormultiple-chip packages and assemblies. Each package has many electricalconnections for carrying signals, power and ground between terminals andthe microelectronic elements, e.g., chips therein. The electricalconnections can include different kinds of conductors such as horizontalconductors, e.g., traces, beam leads, etc., which extend in a horizontaldirection relative to a contact-bearing surface of a chip, verticalconductors such as vias, which extend in a vertical direction relativeto the surface of the chip, and wire bonds which extend in bothhorizontal and vertical directions relative to the surface of the chip.

Conventional microelectronic packages can incorporate a microelectronicelement having active elements defining a memory storage array. Thus, insome conventional microelectronic elements, transistors or other activeelements, constitute a memory storage array with or without additionalelements. In some cases, the microelectronic element can be configuredto predominantly provide memory storage array function, i.e., in whichcase microelectronic element may embody a greater number of activeelements to provide memory storage array function than any otherfunction. In some cases, a microelectronic element may be or include aDRAM chip, or may be or include a stacked electrically interconnectedassembly of such semiconductor chips. Typically, all of the terminals ofsuch package are placed in sets of columns adjacent to one or moreperipheral edges of a package substrate to which the microelectronicelement is mounted. For example, in one conventional microelectronicpackage 12 seen in FIG. 1, three columns 14 of terminals can be disposedadjacent a first peripheral edge 16 of the package substrate 20 andthree other columns 18 of terminals can be disposed adjacent a secondperipheral edge 22 of the package substrate 20. A central region 24 ofthe package substrate 20 in the conventional package does not have anycolumns of terminals. FIG. 1 further shows a semiconductor chip 11within the package having element contacts 26 on a face 28 thereof whichare electrically interconnected with the columns 14, 18 of terminals ofthe package 12 through wire bonds 30 extending through an aperture,e.g., bond window, in the central region 24 of package substrate 20. Insome cases, an adhesive layer 32 may be disposed between the face 28 ofthe microelectronic element 11 and the substrate 20 to reinforce themechanical connection between the microelectronic element and thesubstrate, with the wire bonds extending through an opening in theadhesive layer 32.

In light of the foregoing, certain improvements in the positioning ofterminals on microelectronic packages can be made in order to improveelectrical performance, particularly in assemblies which include suchpackages and a circuit panel to which such packages can be mounted andelectrically interconnected with one another.

SUMMARY OF THE INVENTION

An aspect of the invention provides a microelectronic structure whichcan include a plurality of active elements defining a memory storagearray. The microelectronic structure includes a plurality of addressinputs for receipt of address information specifying locations withinthe storage array. The structure may have a first surface and terminalsexposed at the first surface. The terminals may include first terminalsand the structure can be configured to transfer address informationreceived at the first terminals to the address inputs. Each firstterminal may have a signal assignment which includes information to betransferred to one or more of the address inputs. The first terminalsare disposed on first and second opposite sides of a theoretical planenormal to the first surface, wherein signal assignments of the firstterminals disposed on the first side are symmetric about the theoreticalplane with the signal assignments of the first terminals disposed on thesecond side.

In one example of such microelectronic structure, the signal assignmentof each first terminal on the first side is a mirror image of the signalassignment of each first terminal on the second side.

In another example of such microelectronic structure, each of the firstand second sets of first terminals is configured to carry addressinformation sufficient to specify a location within the memory storagearray. In such example, the microelectronic structure may furtherinclude a plurality of no-connect terminals exposed at the firstsurface. The position of each first terminal on the first side can besymmetric about the theoretical plane with a position of a no-connectterminal on the second side, and in such case, the position of eachfirst terminal on the second side can be symmetric about the theoreticalplane with a position of a no-connect terminal on the first side.

In accordance with one or more examples, the first terminals on each ofthe first and second sides may be configured to receive the addressinformation necessary to uniquely specify a single storage locationwithin the storage array.

In accordance with one or more examples, the first terminals on each ofthe first and second sides can be configured to receive a majority ofthe address information necessary to uniquely specify a single storagelocation within the storage array.

In accordance with one or more examples, the terminals can be configuredto electrically connect the microelectronic structure to correspondingcontacts of a circuit panel.

In accordance with one or more examples, the terminals can be configuredto electrically connect the microelectronic structure to thecorresponding contacts of a circuit panel using a bond metal.

In accordance with one or more examples, the number of active elementsin the storage array can be greater than the number of active elementsin other components of the structure.

In accordance with one or more examples, the structure may furtherinclude a serial presence detect (SPD) element configured tononvolatilely store one or more operational parameters relating to thestorage array.

In accordance with one or more examples, the structure may furtherinclude a serial presence detect (SPD) element configured tononvolatilely store one or more of a serial number, or defectivelocations of the storage array.

In accordance with one or more examples, the first surface of themicroelectronic structure faces a first direction, and the structureincludes one or more semiconductor chips, the address inputs exposed ata surface of at least one of the one or more semiconductor chips, thestructure further including a substrate having a first surface facingthe first direction, and a second surface facing a direction oppositethe first direction, wherein the one or more semiconductor chipsoverlies at least one of the first or second surfaces of the substrate.

In accordance with one or more examples, the first surface of themicroelectronic structure faces a first direction, and the structureincludes a substrate having a first surface facing in the firstdirection and a second surface facing in a direction opposite the firstdirection, wherein at least one of the one or more semiconductor chipsoverlies the first surface of the substrate.

In accordance with one or more examples, the theoretical plane is afirst theoretical plane intersecting the first surface along a lineextending in a first direction, wherein at least some of the terminalsare disposed on first and second opposite sides of a second theoreticalplane normal to the first surface and intersecting the first surfacealong a second line in a second direction transverse to the firstdirection, wherein signal assignments of the at least some terminalsdisposed on the first side of the second theoretical plane are a mirrorimage of the signal assignments of the at least some terminals disposedon the second side of the second theoretical plane.

In accordance with one or more examples, the microelectronic structuremay include a buffer element having a plurality of second activeelements, wherein the buffer element can be configured to at least oneof regenerate, partially or fully decode the address information fortransfer to the at least some address inputs.

In accordance with one or more examples, the storage array can beincorporated in one or more of a plurality of vertically stackedsemiconductor chips at least partially overlying one another.

In accordance with one or more examples, the microelectronic structurecan include a substrate having a first surface, the first surfaces ofthe substrate and the microelectronic structure facing in a firstdirection, wherein the plurality of vertically stacked semiconductorchips overlie a second surface of the substrate facing in a seconddirection opposite the first direction.

In accordance with one or more examples, the microelectronic structureincludes first and second semiconductor chips, each semiconductor chiphaving a face disposed in a single plane parallel to the first surface,wherein at least some of the address inputs can be exposed at the faceof the first semiconductor chip and at least some of the address inputscan be exposed at the face of the second semiconductor chip.

In accordance with one or more examples, the microelectronic structureincludes one or more semiconductor chips and includes a dielectric layerhaving a surface overlying a face of at least one of the one or moresemiconductor chips, the surface of the dielectric layer facing awayfrom the face of the one or more semiconductor chips, the structureincluding traces extending along the dielectric layer and metallizedvias extending from the traces and electrically connected with addressinputs exposed at a surface of the at least one semiconductor chip,wherein the structure can be configured to couple address informationreceived on the terminals to the address inputs through the traces andthe metallized vias.

In accordance with one or more examples, the memory storage array of themicroelectronic structure can include first and second memory storagearrays, and the microelectronic structure may be configured to provideaddress information received on the first terminals on the first side tothe first memory storage array and to provide address informationreceived on the first terminals on the second side to the second memorystorage array so as to provide dual rank memory access.

In accordance with one or more examples, the microelectronic structurecan be configured to provide single rank memory access.

In accordance with another aspect of the invention, a microelectronicassembly is provided which can include a circuit panel having first andsecond oppositely facing surfaces and first and second panel contacts atthe first and second surfaces, respectively; and

First and second microelectronic structures having terminals mounted tothe first panel contacts and the second panel contacts, respectively. Inaccordance with such aspect, each microelectronic structure may includeactive elements defining a memory storage array, address inputs forreceipt of address information specifying locations within the storagearray. The structure may have a first surface and terminals exposed atthe first surface. The terminals may include first terminals and thestructure may be configured to transfer address information received atthe first terminals to the address inputs. In one example, each firstterminal may have a signal assignment which includes information to betransferred to one or more of the address inputs. The first terminalsare disposed on first and second opposite sides of a theoretical planenormal to the first surface. Signal assignments of the first terminalsdisposed on the first side are a mirror image of signal assignments ofthe first terminals disposed on the second side.

In accordance with one or more examples, each microelectronic structuremay include one or more semiconductor chips and the memory storage arrayof each microelectronic structure can be incorporated at least one ofthe one or more semiconductor chips thereof. The first terminals of eachmicroelectronic structure may include terminals configured to carryinformation that controls an operating mode of the at least onesemiconductor chip of the respective microelectronic structure.

In accordance with one or more examples, the first terminals on each ofthe first and second sides of the theoretical plane may be configured tocarry all of the command signals transferred to the respectivemicroelectronic structure. In one example, the command signals mayinclude write enable, row address strobe, and column address strobesignals.

In accordance with one or more examples, the first terminals on each ofthe first and second sides of the theoretical plane can be configured tocarry clock signals transferred to the respective microelectronicstructure, the clock signals including clocks used for sampling signalscarrying the address information.

In accordance with one or more examples, on each microelectronicstructure, the first terminals on each of the first and second sides ofthe theoretical plane can be configured to carry all of the bank addresssignals transferred to such microelectronic structure.

In accordance with one or more examples, the first terminals on thefirst side of the theoretical plane of the first microelectronicstructure can be connected through the circuit panel to the firstterminals on the second side of the theoretical plane of the secondmicroelectronic structure, and the first terminals on the second side ofthe first microelectronic structure can be aligned within one ball pitchof the corresponding first terminals to which they are connected on thefirst side of the second microelectronic structure in x and y orthogonaldirections parallel to the first and second surfaces of the circuitpanel.

In accordance with one or more examples, the first terminals on thesecond side of the first microelectronic structure can be coincidentwith the first terminals on the first side of the second microelectronicstructure to which they are connected in x and y orthogonal directionsparallel to the first and second surfaces of the circuit panel.

In accordance with one or more examples, a length of a stub of at leastone of electrical connections between one of the first terminals of thefirst microelectronic structure and a corresponding one of the firstterminals of the second microelectronic structure can be less than seventimes a minimum pitch of the first terminals of each of themicroelectronic structures.

In accordance with one or more examples, at least some of the electricalconnections through the circuit panel between the first terminals of thefirst and second microelectronic structures may have an electricallength of approximately a thickness of the circuit panel.

In accordance with one or more examples, a total combined length ofconductive elements connecting a pair of electrically coupled first andsecond panel contacts exposed at the first and second surfaces of thecircuit panel can be less than seven times a smallest pitch of the panelcontacts.

In accordance with one or more examples, the circuit panel may include abus having a plurality of conductors configured to carry all of theaddress information transferred to each of the microelectronicstructures. The conductors may extend in a first direction parallel tothe first and second surfaces of the circuit panel.

In accordance with one or more examples, the first terminals can bedisposed within an individual column on each of the first and secondsides of the theoretical plane. The circuit panel may include no morethan one routing layer for global routing of all of the addressinformation between a connection site on the circuit panel at which thefirst terminals of the first and second microelectronic structures areelectrically connected and a different connection site on the circuitpanel at which terminals of at least a third microelectronic structureare electrically connected.

In accordance with one or more examples, the first terminals on each ofthe first and second sides of the theoretical plane can be disposed atpositions within two parallel columns. The circuit panel may include nomore than two routing layers for global routing of all of the addressinformation between respective connection sites on the circuit panel atwhich the terminals of one or more of the microelectronic structures canbe electrically connected.

In accordance with one or more examples, there may be no more than onerouting layer for global routing of all of the address informationbetween a connection site on the circuit panel at which the firstterminals of the first and second microelectronic structures areelectrically connected and a different connection site on the circuitpanel at which terminals of at least a third microelectronic package canbe electrically connected.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a sectional view illustrating a conventional microelectronicpackage.

FIG. 2 is a schematic perspective view illustrating a microelectronicassembly referred to herein.

FIG. 3 is a sectional view illustrating a microelectronic assemblyreferred to herein.

FIG. 4 is a schematic diagram illustrating an electrical interconnectionbetween a pair of microelectronic packages in an assembly as seen inFIG. 3.

FIG. 5 is a sectional view illustrating a microelectronic structure inaccordance with an embodiment of the invention.

FIG. 5A is a plan view illustrating an arrangement of terminals on amicroelectronic structure according to an embodiment of the invention.

FIG. 5B is a further plan view illustrating a possible arrangement ofterminals on a package such as seen in FIG. 5A.

FIG. 5C is a sectional view illustrating a microelectronic packageaccording to an embodiment of the invention.

FIG. 5D is a sectional view illustrating a microelectronic structureaccording an embodiment of the invention.

FIG. 5E is a sectional view illustrating a stacked microelectronicstructure according an embodiment of the invention.

FIG. 5F is a sectional view illustrating a stacked microelectronicstructure according an embodiment of the invention.

FIG. 5G is a sectional view illustrating a microelectronic structureaccording an embodiment of the invention.

FIG. 5H is a plan view illustrating an arrangement of terminals on amicroelectronic structure according to an embodiment of the invention.

FIGS. 6A, 6B and 6C are plan views illustrating various arrangements ofelement contacts on microelectronic elements incorporated in a packageaccording to an embodiment of the invention.

FIG. 7A is a sectional view illustrating a microelectronic assemblyaccording to an embodiment of the invention.

FIG. 7B is a schematic perspective view illustrating a microelectronicassembly according to an embodiment of the invention.

FIG. 8 is a sectional view illustrating a microelectronic packageaccording to an embodiment of the invention.

FIG. 9 is a sectional view illustrating a microelectronic packageaccording to an embodiment of the invention.

FIG. 10 is a sectional view illustrating a microelectronic packageaccording to an embodiment of the invention.

FIG. 11 is a sectional view illustrating a microelectronic packageaccording to an embodiment of the invention.

FIG. 12 is a plan view illustrating a microelectronic package accordingto an embodiment of the invention.

FIG. 13 is a sectional view illustrating a microelectronic packageaccording to an embodiment of the invention.

FIG. 14 is a sectional view illustrating a microelectronic packageaccording to an embodiment of the invention.

FIG. 15A is a sectional view illustrating a microelectronic packageaccording to an embodiment of the invention.

FIG. 15B is a sectional view illustrating a microelectronic packageaccording to an embodiment of the invention.

FIG. 16 is a plan view illustrating a microelectronic package accordingto an embodiment of the invention.

FIG. 17 is a sectional view further illustrating a microelectronicpackage as seen in FIG. 16.

FIG. 18 is a plan view further illustrating a microelectronic packageaccording to an embodiment of the invention as seen in FIG. 16.

FIG. 19 is a sectional view illustrating a microelectronic assemblyincorporating first and second microelectronic packages such as seen inFIG. 16.

FIGS. 20 and 21 illustrate alternative terminal arrangements in amicroelectronic package according to an embodiment of the invention asseen in FIG. 16.

FIG. 22 is a sectional view illustrating a microelectronic packageaccording to a variation of the embodiment of the invention seen in FIG.16.

FIG. 23 is a plan view illustrating a microelectronic package accordingto an embodiment of the invention.

FIG. 24 is a plan view illustrating a microelectronic package accordingto an embodiment of the invention.

FIG. 25 is a plan view illustrating a microelectronic package accordingto an embodiment of the invention.

FIG. 26 is a plan view illustrating a microelectronic package accordingto an embodiment of the invention.

FIG. 27 is a plan view illustrating a microelectronic package accordingto an embodiment of the invention.

FIG. 28 is a plan view illustrating a microelectronic package accordingto an embodiment of the invention.

FIG. 29 is a plan view illustrating a microelectronic package accordingto an embodiment of the invention.

FIG. 30 is a plan view illustrating a microelectronic package accordingto an embodiment of the invention.

FIG. 31 is a schematic sectional view illustrating a system according toan embodiment of the invention.

DETAILED DESCRIPTION

In view of the illustrative conventional microelectronic package 12described relative to FIG. 1, the inventors have recognized improvementswhich can be made that may help improve the electrical performance of amicroelectronic structure incorporating a memory storage array chip, andan assembly which incorporates such microelectronic structure.

Improvements can be made particularly for use of a microelectronicstructure such as a package, for example, when provided in an assemblysuch as shown in FIGS. 2-4, in which a package 12A is mounted to asurface of a circuit panel with another like package 12B mountedopposite thereto on an opposite surface of the circuit panel. Thepackages 12A, 12B typically are functionally and mechanically equivalentto one another. Other pairs 12C and 12D; and 12E and 12F, offunctionally and mechanically equivalent packages typically can also bemounted to the same circuit panel 34. The circuit panel and the packagesassembled thereto may form a portion of an assembly commonly referred toas a dual in-line memory module (“DIMM”). The packages in eachoppositely mounted pair of packages, e.g., packages 12A, 12B, connect tocontacts on opposite surfaces of the circuit panel so that the packagesin each pair overlie one another typically by more than 90% of theirrespective areas. Local wiring within the circuit panel 34 connectsterminals, e.g., the terminals labeled “1” and “5” on each package toglobal wiring on the circuit panel. The global wiring includes thesignal conductors of a bus 36 used to conduct some signals to connectionsites on the circuit panel 34 such as connection sites I, II and III.For example, packages 12A, 12B are electrically connected to the bus 36by local wiring coupled to a connection site I, packages 12C, 12D areelectrically connected to the bus by local wiring coupled to connectionsite II, and packages 12E, 12F are electrically connected to the bus bylocal wiring coupled to connection site III.

The circuit panel 34 electrically interconnects the terminals of therespective packages 12A, 12B using local interconnect wiring thatappears similar to a crisscross or “shoelace” pattern in which aterminal labeled “1” near one edge 16 of package 12A connects throughthe circuit panel 34 to a terminal labeled “1” of package 12B near thesame edge 16 of package 12B. However, the edge 16 of package 12B asassembled to circuit panel 34 is far from the edge 16 of package 12A.FIGS. 2-4 further shows that a terminal labeled “5” near an edge 22 ofpackage 12A is connected through the circuit panel 34 to a terminallabeled “5” of package 12B near the same edge 22 of package 12B. Inassembly 38 the edge 22 of package 12A is far from the edge 22 ofpackage 12B.

Connections through the circuit panel between terminals on each package,e.g., package 12A, to the corresponding terminals on the package mountedopposite thereto, i.e., package 12B, are fairly long. As further seen inFIG. 3, in such assembly of like microelectronic packages 12A, 12B, thecircuit panel 34 may electrically interconnect a signal conductor of thebus 36 with the terminal of package 12A marked “1” and the correspondingterminal of package 12B marked “1”, when the same signal from the bus isto be transmitted to each package. Similarly, the circuit panel 34 mayelectrically interconnect another signal conductor of the bus 36 withthe terminal of package 12A marked “2” and the corresponding terminal ofpackage 12B marked “2”. The same can be true of the electricalconnection through circuit panel 34 of the terminals marked “3” of eachpackage 12A, 12B. The same connection arrangement may also apply toother signal conductors of the bus and corresponding terminals of eachpackage. Local wiring between the bus 36 on the circuit panel 34 andeach package of the respective pair of packages, e.g., packages 12A, 12B(FIG. 2) at a connection site I of the board can be in form ofunterminated stubs. Such local wiring when relatively long may in somecases impact the performance of the assembly 38 as discussed below.Moreover, the circuit panel 34 also requires local wiring toelectrically interconnect certain terminals of other packages: the pairof packages 12C and 12D, and the pair of packages 12E and 12F to theglobal wiring of the bus 36, and such wiring can also impact theperformance of the assembly in the same way.

FIG. 4 further illustrates the interconnection between microelectronicpackages 12A, 12B of respective pairs of terminals assigned to carrysignals “1”, “2”, “3”, “4”, “5”, “6”, “7”, and “8”. As seen in FIG. 4,because the columns 14, 18 of terminals are near the edges 16, 22,respectively, of each package 12A, 12B, the wiring needed to traversethe circuit panel 34 in a direction 40 transverse to the direction 42 inwhich the columns 14, 18 of terminals extend can be quite long. Inrecognition that the length of a microelectronic element such as a DRAMchip can be in the range of ten millimeters on each side, the length ofthe local wiring in a circuit panel 34 in an assembly 38 seen in FIGS.2-4 that is required to route the same signal to the correspondingterminals of two oppositely mounted packages 12A, 12B can range up tofive to ten millimeters in some cases, and may typically be about sevenmillimeters.

In some cases, the lengths of the circuit panel wiring required toconnect the terminals of such oppositely mounted microelectronicpackages may not severely impact the electrical performance of theassembly. However, when the signal carried by the connected pair ofterminals on the packages 12A, 12B is a signal from a bus 36 used tocarry address information or other information such as clock informationusable to sample address information which is common to operation of thememory storage array function of a plurality of packages connected tothe circuit panel, the inventors recognize that the wiring length of thestubs extending from the bus 36 to the terminals on each package maysignificantly affect performance. When the interconnecting wiring isrelatively long, a more severe impact occurs, which can increasesettling time, ringing, jitter, or intersymbol interference for atransmitted signal to an unacceptable degree.

In a particular embodiment, the bus 36 used to carry address informationcan be a command-address bus 36 configured to carry command information,address information, bank address information and clock information. Ina specific implementation, the command information can be transmitted ascommand signals on respective signal conductors on the circuit panel. Itis also possible for the address information to be transmitted asaddress signals on respective signal conductors, as it is also possiblefor the bank address information to be transmitted as bank addresssignals on respective signal conductors, and it is also possible for theclock information to be transmitted as clock signals on respectivesignal conductors. In a specific implementation of a microelectronicelement which has a memory storage array such as a DRAM chip, thecommand signals which can be carried by the bus 36 can be write enable,row address strobe and column address strobe, and the clock signalswhich can be carried by the bus 36 can be clock signals used at leastfor sampling address signals carried by the bus 36.

Accordingly, certain embodiments of the invention described hereinprovide a microelectronic package configured so as to permit the lengthsof stubs on a circuit panel to be reduced when first and second suchpackages are mounted opposite one another on opposite surfaces of acircuit panel, e.g., a circuit board, module board or card, or flexiblecircuit panel. Assemblies which incorporate first and secondmicroelectronic packages mounted opposite one another on a circuit panelcan have significantly reduced stub lengths between the respectivepackages. Reducing the stub lengths within such assemblies can improveelectrical performance, such as by reducing one or more of settlingtime, ringing, jitter, or intersymbol interference, among others.Moreover, it may be possible to obtain other benefits as well, such assimplifying the structure of the circuit panel or reducing thecomplexity and cost of designing or manufacturing the circuit panel, orfor both designing and manufacturing the circuit panel.

Thus, a microelectronic structure 100 according to an embodiment of theinvention is illustrated in FIGS. 5-5A. As seen in FIG. 5, the structure100 has a first surface 201 and a plurality of terminals, e.g., firstterminals 104, and second terminals 106 exposed at the first surface. Asused herein, a statement that an electrically conductive element is“exposed at” a surface of a structure indicates that the electricallyconductive element is available for contact with a theoretical pointmoving in a direction perpendicular to the surface toward the surfacefrom outside the structure. Thus, a terminal or other conductive elementwhich is exposed at a surface of a structure can project from suchsurface; can be flush with such surface; or can be recessed relative tosuch surface and exposed through a hole or depression in the structure.

The microelectronic structure 100 can include active elements 202, e.g.,active devices such as transistors, or other active elements thereon,which, with or without additional elements, define a memory storagearray 204. In one example, the active elements 202 and the memorystorage array 204 defined by the active elements can be incorporated ina portion of a microelectronic element, or in one or moremicroelectronic elements, e.g., one or more semiconductor chips, of themicroelectronic structure, or may be incorporated in one or moremicroelectronic packages or an assembly thereof of the microelectronicstructure. Without limitation, in one example, the microelectronicstructure 100 may be, for example, a microelectronic package or portionthereof wherein the terminals are exposed at a first surface of thepackage. In another example, the microelectronic structure can be anassembly including a plurality of electrically connected microelectronicpackages or a structure which includes electrically connectedmicroelectronic elements, semiconductor chips, or portions ofmicroelectronic elements or semiconductor chips, or portions ofmicroelectronic packages.

In one example, the memory storage array 204 comprises a functional partof the microelectronic structure whose role may be subservient toanother functional part of the microelectronic structure. For example,the microelectronic structure may include a logic functional part, e.g.,processor, and a memory functional part, and the memory functional partmay assist with or help serve a function of the logic functional part.However, in a particular example, the microelectronic structure may beconfigured to predominantly provide memory storage array function. Inthe latter case, the microelectronic structure may have a greater numberof active elements 202, e.g., active devices such as transistors,configured to provide memory storage array function than the number ofactive elements in other components of the structure which areconfigured to provide function other than memory storage array function.

The microelectronic structure may have a plurality of address inputs 206for receipt of address information specifying locations within thememory storage array 204. Thus, the address inputs may be contactsexposed at a surface of a microelectronic element as described above.The microelectronic structure is configured so as to transfer addressinformation received at particular terminals of the microelectronicstructure to the address inputs 206. For example, the microelectronicstructure may couple signals received on particular terminals of thestructure to corresponding particular address inputs 206. In aparticular example, the address inputs can be exposed at a face 207 of amicroelectronic element 101, e.g., a semiconductor chip, wherein theface 207 faces towards the first surface 201 of the microelectronicstructure. In another example, the address inputs 206 can be exposed ata face 209 of a microelectronic element 101 which faces away from thefirst surface 201. In one example, the microelectronic structure maycontain wiring therein which directly electrically couples a set of theterminals, e.g., “first terminals” 104 with corresponding address inputsof the structure. As used herein, each “first terminal” 104 has a signalassignment on the microelectronic structure which includes one or moreof the address inputs 206. In another example, as further describedbelow, the microelectronic structure may include a buffer element, suchas a semiconductor chip having a plurality of active elements thereon,such semiconductor chip being configured to at least one of regenerate,or partially or fully decode at least one of address or commandinformation received at the first terminals for transfer by themicroelectronic structure to the address inputs. Command information maybe information that controls an operating mode of a memory storage arrayor portion thereof within the microelectronic structure.

The microelectronic structure may further include a nonvolatile memoryhaving at least a portion thereof configured to perform serial presencedetect (“SPD”) function, as a “SPD element” of the microelectronicstructure. Such SPD element can contain operational parameterspertaining to at least one of the organization, timing or capacity ofthe microelectronic structure. In one embodiment, the SPD element can beincorporated in a semiconductor chip other than one or moresemiconductor chips in which a memory storage array is provided and towhich the address information is provided by way of the address inputs.In one example, the operational parameters may pertain to timing such asthe number of clock cycles of latency after the row address strobesignal is detected in an enabled state by circuitry of themicroelectronic structure (hereinafter, “RAS latency”), or may pertainto the number of clock cycles of latency after the column address strobesignal is detected in an enabled state by circuitry of themicroelectronic structure, or may pertain to the capacity of themicroelectronic structure, e.g., such as one gigabit (“1Gb”), twogigabit (“2Gb”), etc., or may pertain to the organization of themicroelectronic structure, such as a “single-rank”, “2-rank”, “4-rank”or other structure, etc., or other operating parameter, or a combinationof the foregoing operational parameters, or other operating parameter.In one example, the nonvolatile memory may store information of a singleone of the aforementioned parameters or may store information of anycombination of the operational parameters, without limitation. In aparticular example, the SPD may contain a table of known bad memorylocations within the memory storage array of the microelectronicstructure which should be avoided during read or write access to thememory storage array.

A theoretical plane 132 extends through the microelectronic structure ina direction normal to the first surface 201 at a location between firstand second oppositely-facing edges 140, 141 of the microelectronicstructure. The relationship between the theoretical plane and otherstructure will become clear from the examples provided below. As furtherseen in FIG. 5A, the microelectronic structure 100 has a plurality offirst terminals thereon, e.g., terminals 104, disposed on first andsecond opposite sides of the theoretical plane 132. The terminals may beelectrically conductive elements, e.g., contacts, pads, posts, pins,sockets, wiring, which are exposed at the first surface. In some cases,the terminals can be configured to be conductively bonded tocorresponding contacts of another element, e.g. a circuit panel, such aswith a conductive bond material which in some cases can be a bond metalsuch as solder, tin or gold, among others. In such case, the terminalsmay include joining elements of fusible conductive material such assolder balls, gold bumps, an electrically conductive matrix materialcontaining metal and polymeric material, or combination of one or moreof the foregoing, which are attached to surfaces of metallic elements ofthe terminals, e.g., pads or posts. In other cases, the terminals can beconfigured to mechanically and electrically engage correspondingfeatures of another component, such as by a pressure or interference fitbetween corresponding conductive elements of each component, which insome cases, may slide or wipe relative to corresponding conductivesurfaces they engage.

As further seen in FIGS. 5A and 5B, a first set of the first terminals104 are disposed on a first side of the theoretical plane 132 and asecond, e.g., duplicate set of the first terminals 104 are disposed on asecond side of the theoretical plane 132 which is opposite the firstside. The microelectronic structure is configured to provide addressinformation received at the first terminals to the address inputs. Asused herein in the context of address information or command address businformation or signals and the address inputs of a microelectronicelement or portion thereof, a statement that address information onterminals is provided to address inputs” means that the addressinformation on the terminals is transferred to the address inputs viaelectrical connections therewith, or through a buffer element which mayperform at least one of regenerating, partially decoding or decoding ofthe address information received at the terminals. As further seen inFIG. 5A, signal assignments of the first set of first terminals 104 area mirror image of the signal assignments of the second set of the firstterminals 104.

As used herein, signal assignments of a pair of first terminals disposedon respective opposite sides of the theoretical plane 132 are a mirrorimage of one another when the signals assigned to each terminal of thepair are functionally equivalent. An address signal which has the samefunction as another signal in specifying a location within an addressspace is functionally equivalent to the other address signal. This canbe best seen in an example in which a pair of address terminals on amicroelectronic structure, e.g., “A2L” (A2_Left) and “A2R” (A2_Right)each specifies a bit of weight 2̂2 (2 to the power of 2) in an addressused to specify a location within the same address space. Theseterminals have the same signal assignments because each of the signalsA2L and A2R could be used to specify a like portion of an address withinthe same address space or within equivalent address spaces. In oneexample in accordance therewith, it is apparent that the addressinformation transferred to either one or both of the terminals of thepackage A2L and A2R can be transferred to a corresponding address input,e.g., element contact having the same name “A2” on one or moremicroelectronic elements incorporated in the microelectronic structure100 (FIG. 5). Thus, in one example, it is possible the signals assignedto each pair of first terminals having mirror image signal assignments,e.g., a signal A2L in the first set of first terminals and a signal A2Rin the second set, could originate from the identical output of drivercircuitry at a location external to the microelectronic structure.Further in such example, while the panel contacts exposed at an exteriorof a circuit panel through which the signals A2L and A2R are received atthe terminals of the microelectronic structure are separate, in somecases the panel contacts may be electrically tied together at one ormore other locations of the circuit panel. Thus, in some cases, the pairof equivalent signals A2L and A2R are driven as a single signal at suchother circuit panel location.

In another example, the microelectronic structure may comprise multiplemicroelectronic elements in which address information is provided to oneor more of the microelectronic elements in the microelectronic structureseparately from address information provided to a different one or moreof the microelectronic elements of the same structure. In this case,although address information is received on first and second sets ofterminals on each of the first and second sides of the theoreticalplane, the address information received at the first terminals on thefirst side of the theoretical plane may be provided only to addressinputs of a first one or more microelectronic elements of themicroelectronic structure. Conversely, the address information receivedat the first terminals on the second side of the theoretical planeopposite from the first side may be provided only to address inputs of asecond one or more of the microelectronic elements of themicroelectronic structure. In one example, the first one or moremicroelectronic elements may lie on the first side of the theoreticalplane, and the second one or more microelectronic elements may lie onthe second side of the theoretical plane. In such case, the addressinformation received on a terminal of the package having a signalassignment A2L and the address information on a terminal of the packagehaving a signal assignment A2R which is a mirror image therefrom caneach be transferred to element contacts having the same name “A2” ofrespective first and second microelectronic elements of themicroelectronic structure 100 (FIG. 5).

The signal assignments of each of the first and second sets of firstterminals, which may be disposed in respective first and second grids114, 124 are seen to be symmetric about the theoretical plane 132, suchthat the terminal 114-1 of the first set which is assigned to receivesignal A15 is symmetric about the theoretical plane 132 from thecorresponding terminal 124-1 of the second set which is assigned toreceive signal A15. The same relationship between first terminals onopposite sides of the theoretical plane 132 is represented in thevarious cross-sectional views provided in FIG. 5 and other figures inthe application. Specifically, the notation “A” in such figures denotesthe positions of a pair of first terminals having the same signalassignments for receipt of address information to be transferred to theaddress inputs, such first terminals disposed at respective mirror imagepositions within each microelectronic structure 100, etc.

In some cases, the first terminals on each of the first and second sidesof the theoretical plane may be configured to receive each of thesignals necessary to uniquely specify a single storage location withinthe storage array. In other cases, the first terminals on each of thefirst and second sides may be configured to receive only a majority ofthe signals necessary to uniquely specify a single storage locationwithin the storage array.

Although the theoretical plane 132 can extend through themicroelectronic structure at a number of locations which can be closerto edge 140 than edge 141, or can be closer to edge 141 than edge 140,in a particular example and as shown in FIG. 5A, the theoretical planecan extend through the structure 100 at a location midway between theedges 140, 141.

In a particular example as further seen in FIG. 5A the first surface 201of the microelectronic structure faces in a first direction 214, and themicroelectronic structure 100 includes a substrate 102 having a firstsurface 110 facing in the same first direction. A second surface 108 ofthe substrate 102 may face in a second direction 216 opposite the firstdirection.

In such example, in some cases, a microelectronic element 101 such as asemiconductor chip, on which some or all of the active elements 202 areprovided, may have a face 209 which faces away from the second surface108 of the substrate 102. As further seen in the particular example inFIG. 5C, a microelectronic element 101 incorporated in themicroelectronic structure 100 may have element contacts 111, 113 at afront face 105 thereof which are electrically connected to respectivesubstrate contacts 121, 123 at second surface 108 of the substrate 102.For example, wirebonds 112 may electrically connect the element contacts111, 113 with the substrate contacts 121, 123. Alternatively, othertypes of conductors, e.g., portions of a lead frame, flexible ribbonbonds, etc., may be used to electrically connect the element contacts111, 113 with the respective substrate contacts 121, 123, which in somecases may connect the element contacts 111, 113 with other conductiveelements disposed at a greater height from the substrate surface 108than the front face 105 of the microelectronic element 101. In one typeof such microelectronic element 101, each one of some contacts of theelement contacts 111, 113 may be configured to receive particularaddress information of the address information supplied to themicroelectronic element. In a particular embodiment, each of suchcontacts 111, 113 may be an address input configured to receive addressinformation, supplied to the microelectronic element 101 from outsidethe microelectronic element, i.e., through wiring of the package such aswire bonds 112, and through the first terminals 104. Contacts 111, 113,may also be configured to receive other information or signals fromoutside the microelectronic element, such as, without limitation,through wire bonds 112 and second terminals 106.

In one particular example of such microelectronic element 101, theaddress information present at the element contacts 111, 113 can besampled relative to an edge of a clock used by the respectivemicroelectronic element, i.e., upon on a transition of the clock betweenfirst and second different voltage states. That is, each address signalcan be sampled upon a rising transition between a lower voltage stateand a higher voltage state of the clock, or upon a falling transitionbetween a higher voltage state and a lower voltage state of the clock.Thus, the plurality of address signals may all be sampled upon therising transition of the clock, or such address signals may all besampled upon the falling transition of the clock, or in another example,the address signal at one of the element contacts 111, 113 can besampled upon the rising transition of the clock and the address signalat one other external contact can be sampled upon the falling transitionof the clock.

In another type of microelectronic element 101, which may be configuredto predominantly provide memory storage array function, one or more ofthe address contacts thereon can be used in a multiplexed manner. Inthis example, a particular element contact 111, 113 of the respectivemicroelectronic element 101 can receive two or more different signalssupplied to the microelectronic element from the outside. Thus, a firstaddress signal can be sampled at the particular contact 111, 113 upon afirst transition of the clock between the first and second differentvoltage states (e.g., a rising transition), and a signal other than thefirst address signal can be sampled at the particular contact upon asecond transition of the clock (e.g., a falling transition) between thefirst and second voltage states that is opposite the first transition.

In such a multiplexed manner, two different signals can be receivedwithin the same cycle of the clock on the same element contact 111, 113of the respective microelectronic element 101. In a particular case,multiplexing in this manner can allow a first address signal and adifferent signal to be received in the same clock cycle on the sameelement contact 111, 113 of the respective microelectronic element 101.In yet another example, multiplexing in this manner can allow a firstaddress signal and a second different address signal to be received inthe same clock cycle on the same element contact 111, 113 of therespective microelectronic element 101.

In some embodiments, the substrate 102 can include a sheet-like orboard-like dielectric element, which may consist essentially ofpolymeric material, e.g., a resin or polyimide, among others.Alternatively, the substrate can include a dielectric element having acomposite construction such as glass-reinforced epoxy, e.g., of BT resinor FR-4 construction. In some examples, the dielectric element has acoefficient of thermal expansion in the plane of the dielectric element,i.e., in a direction parallel to a first surface 110 thereof, of up to30 parts per million per degree Celsius (hereinafter, “ppm/° C.”). Inanother example, the substrate can include a supporting element ofmaterial having a coefficient of thermal expansion (“CTE”) of less than12 parts per million per degree Celsius, on which the terminals andother conductive structure are disposed. For example, such low CTEelement can consist essentially of glass, ceramic or semiconductormaterial or liquid crystal polymer material, or a combination of suchmaterials.

As seen in FIG. 5C, a first set 121 and a second set 123 of substratecontacts can be exposed at the second surface 108 of the substrate. Thefirst set 121 of substrate contacts can be electrically connected with acolumn 111 (FIG. 6A) of element contacts 132 of the microelectronicelement, such as through electrically conductive structure extendingabove the face 105 of the microelectronic element. For example, theconductive structure can be wire bonds 112. In some cases, a die attachadhesive may be disposed between a rear face 107 of the microelectronicelement and the second surface 108 of the substrate 102, which maymechanically reinforce the connection between the microelectronicelement and the substrate. The second set 123 of the substrate contactscan be electrically connected with a column 113 (FIG. 6A) of elementcontacts 131.

As further seen in FIG. 6A, an edge 170 of microelectronic element 130can extend in the first direction 142 and a column 111 of contacts 131adjacent to edge 170 can extend in the same first direction 142 alongthe face 105. Another edge 172 of microelectronic element 130, parallelto edge 170, extends in the first direction 142 and a second column 113of contacts 131 may extend in the same first direction 142 along theface 105 adjacent to edge 172. As further shown in FIG. 6A, a column ofcontacts on the microelectronic element can be fully populated as in thecase of column 111, or a column of contacts may have only have contactsat some of the positions within the column, as in the case of column113. Conductive structure such as wire bonds 112 (FIG. 5C) mayelectrically connect the contacts 111, 113 with corresponding contacts121, 123 exposed at a second surface 108 of the substrate.

FIG. 6B illustrates a variation of the embodiment shown in FIG. 6A inwhich contacts 131 of a microelectronic element 180 can be disposed incolumns and rows adjacent to and aligned with respective peripheraledges 170, 172, 176, 178 of the microelectronic element 180. Edges 170,172 are parallel and extend in a first direction 142.

FIG. 6C illustrates another variation of the embodiment shown in FIG. 6Ain which the contacts of a microelectronic element 190 are disposed incolumns 188 and 189 adjacent to edges 170, 172 of the microelectronicelement. However, in this case, the microelectronic element 190 includesa semiconductor chip having a conductive redistribution layer thereon,and the contacts 131 can include columns 188, 189 of redistributioncontacts which are connected to the contacts 192, 194 of thesemiconductor chip by conductive traces, or metalized vias formed incontact with the contacts 192, 194 of the semiconductor chip (or whichcan be connected to the contacts 192, 194 of the chip by both metalizedvias and traces). In this case, contacts 192, 194 may in some cases beconnected with active devices of the semiconductor chip through back endof line (“BEOL”) wiring of the semiconductor which may include vias orother electrically conductive structure and which may in some cases bedisposed underneath the contacts 192, 194.

As particularly shown in FIGS. 6A-C, in some embodiments, the contactsof the microelectronic element may be arranged in a single column suchas the column of contacts 192, or the contacts may be arranged in aplurality of columns as shown for the columns of contacts 111, 113together. Each column may contain a contact at each vertical layoutposition of the column along direction 142, or a contact may be missingfrom one or more positions of a column, as in the case of one of thecolumns of contacts 113. In a particular embodiment, the contacts may bearranged in an area array over the face 105 (FIG. 5C) of themicroelectronic element, i.e., such as an area array distributed overthe face 105 or some portion of the face 105 of the microelectronicelement shown in FIG. 6A, instead of the arrangement of contacts asshown in FIG. 6A. In another example, the contacts of a microelectronicelement can be arranged in one or more sets of contacts adjacent one ormore peripheral edges of the microelectronic element indicated by thedashed lines marking the boundaries of the microelectronic element inFIG. 5B. In a particular example, the microelectronic element can be asingle semiconductor chip and the contacts 111, or 113 thereon may be“chip contacts” which are the contacts of the semiconductor chip.

In another example, referring to FIG. 6C, a particular microelectronicelement 190 may have a single column of chip contacts 192 exposed at theface 105. The column of chip contacts 192 can be disposed at or near atheoretical axis 174 parallel to and halfway between first and secondopposite edges 170, 172 of the microelectronic element and can extend ina direction parallel to the axis 174. For example, the face 105 may havefirst and second peripheral regions adjacent the first and second edges170, 172 of the microelectronic element 190, respectively, and thecolumn of chip contacts 192 can be disposed in a central region 181 ofthe face 105 found between the first and second peripheral regions 184,186. The central region can be disposed in an area defined bytheoretical boundaries 182, 183 parallel to the first and second edges170, 172. As used herein, the “central region” of the face of amicroelectronic element or semiconductor chip means the area of the facehaving parallel boundaries extending throughout a dimension of the facein a direction parallel to first and second opposite edges of the face,wherein the central region spans a middle third of a shortest dimensionof the face between the first and second opposite edges. Accordingly,the first peripheral region spans a third of the shortest dimension ofthe face between the central region and the first edge, and the secondperipheral region spans a third of the shortest dimension between thecentral region and the second edge.

In one example, wire bonds 112 may extend directly from such column ofchip contacts 192 to substrate contacts such as contacts 121, or tocontacts 123. Alternatively, some wire bonds 112 may extend from suchchip contacts 192 to contacts 121 and some wire bonds 112 may extendfrom such chip contacts 192 to contacts 123.

Alternatively, the microelectronic element may have more than one columnof chip contacts. For example, FIG. 6C shows a microelectronic elementhaving a first column of chip contacts 192 and a second column of chipcontacts 194. Each of the columns 192, 194 of chip contacts can bedisposed adjacent to, e.g., in close proximity to the axis 174, i.e.,within the central region 181. The microelectronic element may in somecases have three or more columns of contacts.

In the particular example shown in FIG. 6C, the microelectronic elementmay have first and second columns of chip contacts 192 and 194, and thecontacts 111, or 113 may include redistribution contacts which areformed on a face 105 thereof, and which are electrically connected tothe chip contacts by conductive elements such as traces and vias, forexample. Unless otherwise noted, the “contacts” of the microelectronicelements in each of the examples herein can be arranged in any of thesedescribed ways.

The microelectronic element may also include additional contacts thatmay not be disposed within a column of the element contacts. In someexamples, the additional contacts may be used for connection to power,ground, or as contacts available for contact with a probing device, suchas may be used for testing.

As seen in FIG. 5C, the package 100 can have first terminals 104 andsecond terminals 106 for electrically and mechanically connecting thepackage 100 with a component external to the package 100, such as acircuit panel, for example. The terminals 104, 106 can be electricallyconductive pads, posts, or other electrically conductive structure. Inthe example seen in FIG. 5C, the terminals in some cases may includejoining elements 133, such as may include a bond metal such as solder,tin, indium, gold, or a eutectic material, among others, or otherconductive bond material, and may in some cases also include additionalstructure such as a conductive bump attached to conductive structure ofthe substrate such as conductive pads or posts. The first terminals 104and the second terminals 106 can be electrically connected with thesubstrate contacts 121, 123 through electrically conductive structure onthe substrate, such as traces and vias, for example.

In a particular example, a first set of the first terminals 104 can bearranged at positions within a first grid 114 exposed at a first surface110 of the substrate 102 opposite from the second surface 108. A secondset of the first terminals 104 can be arranged at positions within asecond grid 124 exposed at the first surface 110 of the substrate whichis disposed at a side of the theoretical plane 132 opposite from thefirst set of first terminals. Although, in some of the figures, thefirst and second sets are shown extending beyond the outer boundaries ofthe front surface of the microelectronic elements, that need not be thecase. In certain embodiments of the invention, the set of firstterminals within each set can be configured to carry the above-notedaddress information or, in a particular embodiment, the above-notedaddress information and certain signals of the command-address bus.

For example, when the microelectronic element 101 includes or is a DRAMsemiconductor chip, each of the first and second sets is configured tocarry address information transferred to the microelectronic package 100which is usable by circuitry within the package, e.g., row address andcolumn address decoders, and bank selection circuitry, if present, todetermine an addressable memory location from among all the availableaddressable memory locations of a memory storage array within amicroelectronic element in the package. In a particular embodiment, eachof the first and second sets can be configured to carry all the addressinformation used by such circuitry within the microelectronic package100 to determine an addressable memory location within such memorystorage array.

In a variation of such embodiment, the first terminals disposed atpositions within the first and second grids 114, 124 can be configuredto carry a majority of the address information that is used by suchcircuitry within the microelectronic package 100 to determine anaddressable memory location within such memory storage array, and thenother terminals such as at least some of the above-referenced secondterminals 106 on the microelectronic package would then be configured tocarry the remaining part of the address information. In such variation,in a particular embodiment, the first terminals in each of the first andsecond sets are configured to carry three-quarters or more of theaddress information that is used by such circuitry within themicroelectronic package 100 to determine an addressable memory locationwithin such memory storage array.

In a particular embodiment, the terminals in each of the first andsecond sets, e.g., grids 114, 124 may not be configured to carry chipselect information, e.g., information usable to select a particular chipwithin the microelectronic package 100 for access to a memory storagelocation within the chip. In another embodiment, the first terminals inat least one of the first and second sets may indeed carry chip selectinformation.

Typically, when the microelectronic element 101 in the microelectronicpackage 100 is or includes a DRAM chip, the address information in oneembodiment can include all address information transferred to thepackage from a component external to the package, e.g., a circuit panelsuch as the circuit panel 154 (FIG. 7A) described below, which is usedfor determining a random access addressable memory location within themicroelectronic package for read access thereto, or for either read orwrite access thereto.

At least some of the second terminals 106 can be configured to carrysignals other than the address signals that are carried by the firstterminals 104 of the first and second sets. In particular examples, thesecond terminals 106 may carry one or more of data, data strobe signals,or other signals or reference potentials such as chip select, reset,power supply voltages, e.g., Vdd, Vddq, and ground, e.g., Vss and Vssq.Some or all second terminals can also be disposed at locations withinthe same first and second grids 114, 124 in which the first and secondsets of first terminals are disposed. In such case, some terminalsdisposed at locations within the first and second grids 114, 124 can beconfigured to carry one or more of data, data strobe signals, or othersignals or reference potentials such as chip select, reset, power supplyvoltages, e.g., Vdd, Vddq, and ground, e.g., Vss and Vssq. Someterminals disposed at locations within the third and fourth grids 116,126 can be configured to carry one or more of data, data strobe signals,or other signals or reference potentials such as chip select, reset,power supply voltages, e.g., Vdd, Vddq, and ground, e.g., Vss and Vssq.

In a particular embodiment, the first terminals which are disposed infirst and second grids 114, 124 of each microelectronic package can beconfigured to carry information that controls an operating mode of themicroelectronic element 101. More specifically, each of the first andsecond sets of first terminals may be configured to carry all of aparticular set of command signals and/or clock signals transferred tothe microelectronic package 100. In one embodiment, the first terminals104 of each of the first and second sets can be configured to carry allof the command signals, address signals, bank address signals, and clocksignals transferred to the microelectronic package 100 from an externalcomponent, e.g., circuit panel or other device, wherein the commandsignals include row address strobe, column address strobe and writeenable.

In an embodiment in which one or more of the microelectronic elementsare configured to provide dynamic memory storage array function, such asprovided by a dynamic random access memory (“DRAM”) semiconductor chip,or an assembly of DRAM chips, the command signals can be write enable,row address strobe, and column address strobe signals. Other signalssuch as ODT (on die termination), chip select, clock enable, may or maynot be carried by terminals disposed within first and second sets, suchas in grids 114, 124. The clock signals can be clocks used by one ormore of the microelectronic elements for sampling the address signals.For example, in the microelectronic package of FIG. 7 and as furthershown in FIG. 5A, the first terminals 104 can be configured to carryclock signals CK and CKB, row address strobe RAS, column address strobeCAS and write enable signals WE, as well as address signals A0 throughA15 inclusive, and bank address signals BA0, BA1 and BA2.

In the embodiment illustrated in FIGS. 5A-5C, at least some of thesecond terminals 106, which can be disposed at positions within thirdand fourth grids 116, 126, can be configured to carry signals other thanthe command signals, address signals, and clock signals that are carriedby the first terminals 104 disposed at positions within the first andsecond grids 114, 124. Signals or reference potentials such as chipselect, reset, power supply voltages, e.g., Vdd, Vddq, and ground, e.g.,Vss and Vssq, may or may not be carried by the second terminals 106 inany of the embodiments referred to herein, unless otherwise noted.

In one embodiment, at least some of the second terminals 106 that areconfigured to carry signals other than the address signals can bearranged at positions within the first and second grids 114, 124. In oneexample, at least some of the second terminals 106 that are configuredto carry signals other than the command signals, address signals, andclock signals can be arranged at positions within the first and secondgrids 114, 124. Although particular configurations of second terminals106 are shown in the figures, the particular configurations shown arefor illustrative purposes and are not meant to be limiting. For example,the second terminals 106 can also include terminals that are configuredto be connected to power or ground signals.

An arrangement of the first terminals in the first and second grids 114,124 of the package is particularly shown in FIGS. 5A-C. In one example,each grid 114, 124 may include first and second parallel columns 136 ofterminals. The columns 136 of terminals in each grid can be adjacent toone other. Alternatively, although not shown in FIGS. 5A-C, at least oneterminal may be disposed between the first and second columns ofterminals. In another example, such as seen in FIG. 5B, the grids mayinclude a column of terminals for which a column axis 119 extendsthrough a majority of the terminals 104 of such column, i.e., iscentered relative thereto. However, in such column, one or more of theterminals might not be centered relative to the column axis 119, as inthe case of terminals 104′. In this case, these one or more terminalsare considered part of a particular column, even though such terminal(s)might not be centered relative to axis 119 because they are closer tothe axis 119 of that particular column than to the axis of any othercolumn. The column axis 119 may extend through these one or moreterminals which are not centered relative to the column axis, or, insome cases, the non-centered terminals may be farther from the columnaxis such that the column axis 119 may not even pass through thesenon-centered terminals of the column. There may be one, several or manyterminals in one column or even in more than one column which are notcentered with respect to a column axis of the respective column in agrid.

Moreover, it is possible for the grids of terminals to containarrangements of terminals in groupings other than columns, such as inarrangements shaped like rings, polygons or even scattered distributionsof terminals. As shown in FIG. 5C, an encapsulant 146 may overlie thesecond surface 108 of the substrate and may contact the microelectronicelement 101 therein. In some cases, the encapsulant may overlie a frontsurface 105 of the microelectronic element which faces away from thesubstrate 102.

As in the above example provided in FIG. 5, and as also seen in FIG. 5A,the signal assignments of the first terminals in the second grid 124 area mirror image of the signal assignments 124 of the first terminals inthe first grid 114. Stated another way, the signal assignments of thefirst terminals in the first and second grids are symmetric about thetheoretical plane or axis 132 between the first and second grids 114,124, the axis 132 in this case extending in a direction 142 in whichcolumns 136 of the first terminals extend. With the signal assignmentsin the second grid 124 being a mirror image of those in the first grid114, a first terminal 114-1 of the first grid 114 which is assigned tocarry the signal A15 is in the same relative vertical position (indirection 142) within the grid as the corresponding first terminal 124-1of the second grid 124 which is assigned to carry the signal A15.However, since the first grid 114 contains two columns 136 and theterminal 114-1 of the first grid 114 assigned to carry the signal A15 isin the left column among the two columns 136 of the first grid 114, themirror image arrangement requires that the corresponding terminal 124-1of the second grid 124 assigned to carry the signal A15 is in the rightcolumn among the two columns of the second grid 124. Another result ofthis arrangement is that the terminal assigned to carry the signal A9 isalso in the same relative vertical position within the grid in each ofthe first and second grids 114, 124. However, in the first grid 114, thefirst terminal 114-1 assigned to carry A9 is in the right column amongthe two columns 136 of the first grid 114, and the mirror imagearrangement requires that the corresponding terminal 124-2 of the secondgrid 124 assigned to carry the signal A9 is in the left column among thetwo columns of the second grid 124. As can be seen in FIG. 5A, the samerelationship applies for each first terminal in each of the first andsecond grids, at least for each first terminal assigned to carry addressinformation for receipt by an address input of the microelectronicstructure as discussed above.

The theoretical plane 132 about which the signal assignments of thefirst terminals are symmetric can be located at various positions on thesubstrate. The theoretical plane 132 can be considered an axis, which insome embodiments, can be a central axis of the package that is locatedequidistant from first and second opposed edges 140, 141 of thesubstrate particularly when the columns 136 of the first terminalsextend in a direction parallel to the edges 140, 141 and the first andsecond grids are disposed at locations which are symmetric about thiscentral axis. In one example, the axis 132 may be located within adistance no greater than three and one-half times a minimum pitchbetween any two adjacent columns of terminals from a line which isparallel to and equidistant from the first and second edges 140, 141 ofthe substrate. Alternatively, this axis of symmetry 132 can be offset ina horizontal direction 135 from the central axis that is equidistantbetween edges 140, 141.

In a particular example, terminals in the first and second grids can belocated in a central region of the package. In one example, at least onecolumn 136 of terminals in each of the first and second grids 114, 124can be disposed within a distance not greater than three and one-halftimes the minimum pitch between any two adjacent parallel columns 136 ofthe terminals from a line which is equidistant from and parallel to thefirst and second edges 140, 141 of the substrate.

As mentioned above, the second terminals 106 can be configured to carryinformation other than the above-noted address information or other thansignals of the above-noted command-address bus. In one example, thesecond terminals 106 can include terminals used for carryinguni-directional or bi-directional data signals to and or from themicroelectronic element, and data strobe signals, as well as data masksand ODT or “on die termination” signals used to turn on or off parallelterminations to termination resistors. In particular examples, thesecond terminals may carry signals such as chip select, reset, clockenable, as well as reference potentials such as power supply voltages,e.g., Vdd, Vddq, or ground, e.g., Vss and Vssq. In some embodiments itis possible for some or all terminals that are configured to carrysignals other than the command-address bus signals to be disposed assecond terminals 106 on the package, wherever they can be suitablyplaced. For example, some or all of the second terminals 106 can bearranged in the same grids 114, 124 on the substrate 102 in which thefirst terminals 104 are arranged. Some or all of the second terminals106 may be disposed in the same column or in different columns as someor all of the first terminals 104. In some cases, one or more secondterminals can be interspersed with the first terminals in the same gridsor column thereof.

In a particular example, some or all of the second terminals 106 can bedisposed in a third area or grid 116 exposed at the first surface 110 ofthe substrate, and another set of the second terminals can be disposedin a fourth area or grid 126 exposed at the first surface 110. In aparticular case, the signal assignments of the second terminals in thethird area or grid 116 can be a mirror image of the signal assignmentsof the second terminals in the fourth area or grid 126, in like mannerto that described above for the first and second grids. The third andfourth grids 116, 126 may in some cases extend in the direction 134 inwhich the first and second grids extend and can be parallel to oneanother. The third and fourth grids may also be parallel to the firstand second grids 114, 124. Alternatively, referring to FIG. 5A, grids127, 137 in which second terminals are disposed can extend in anotherdirection 135 which is transverse to or even orthogonal to direction142. In another example, some second terminals can be disposed withineach of the grids 116, 126, 127 and 137 shown in FIG. 5A. Some secondterminals may or may not also be disposed at positions within the firstand second grids 114, 124.

Also, as shown in FIG. 5A, the signal class assignments of the secondterminals in grid 127 can be symmetric about the vertical axis 132, andthe signal class assignments of the second terminals in grid 137 can besymmetric about the vertical axis 132. As used herein, two signal classassignments can be symmetric with respect to one another if the signalassignments are in the same class of assignments, even if the numericalindex within the class differs. Exemplary signal class assignments caninclude data signals, data strobe signals, data strobe complementsignals, and data mask signals. In a particular example, in grid 127,the second terminals having signal assignments DQSH and DQSL aresymmetric about the vertical axis 132 with respect to their signal classassignment, which is data strobe, even though those second terminalshave different signal assignments.

As further shown in FIG. 5A, the assignments of the data signals to thespatial positions of the second terminals on the microelectronicpackage, such as for data signals DQ0, DQ1, . . . , for example, canhave modulo-X symmetry about the vertical axis 132. The modulo-Xsymmetry can help preserve signal integrity in an assembly 200 or 354such as seen in FIGS. 7A and 7B, in which one or more pairs of first andsecond packages are mounted opposite one another to a circuit panel, andthe circuit panel electrically connects corresponding pairs of secondterminals of those first and second packages in each oppositely mountedpackage pair. When the signal assignments of terminals have “modulo-Xsymmetry” about an axis, terminals that carry signals which have thesame number “modulo-X” are disposed at positions which are symmetricabout the axis. Thus, in such assembly 200 or 354 such as in FIGS.7A-7B, modulo-X symmetry can permit electrical connections to be madethrough the circuit panel so that a terminal DQ0 of a first package canbe electrically connected through the circuit panel to a terminal DQ8 ofthe second package which has the same number modulo X (X being 8 in thiscase), so that the connection can be made in a direction essentiallystraight through, i.e., normal to, the thickness of the circuit panel.Thus, a number resulting from the operation 8 modulo 8 is 0, and anumber resulting from the operation 9 modulo 8 is 1. Therefore, when thesignal assignments have modulo-8 symmetry, a terminal which isconfigured to carry a signal such as DQ1, for which the modulo 1operation yields a result of “1”, is disposed at a position on thesubstrate which is symmetric about an axis with another terminalconfigured to carry a signal such as DQ9 or DQ17 for which the modulo 8operation yields the same result, i.e., “1”.

In one example, “X” can be a number 2n (2 to the power of n), wherein nis greater than or equal to 2, or X can be 8×N, N being two or more.Thus, in one example, X may be equal to the number of bits in ahalf-byte (4 bits), byte (8 bits), multiple bytes (8×N, N being two ormore), a word (32 bits) or multiple words. In such way, in one example,when there is modulo-8 symmetry as shown in FIG. 5A, the signalassignment of a package terminal DQ0 in grid 127 is configured to carrydata signal DQ0 is symmetric about the vertical axis 132 with the signalassignment of another package terminal DQ8 configured to carry datasignal DQ8. Moreover, the same is true for the signal assignments ofpackage terminals DQ0 and DQ8 in grid 137137 about the vertical axis,and the same is also true for grid 137. Modulo-8 symmetry such asdescribed herein can be seen in grids 127, 137 with respect to each ofthe signal assignments of package terminals DQ0 through DQ15.

It is important to note that, although not shown, the modulo number “X”can be a number other than 2n (2 to the power of n) and can be anynumber greater than two. Thus, the modulo number X upon which thesymmetry is based can depend upon how many bits are present in a datasize for which the package is constructed or configured. For example,when the data size is 10 bits instead of 8, then the signal assignmentsmay have modulo-10 symmetry. It may even be the case that when the datasize has an odd number of bits, the modulo number X can have suchnumber.

FIG. 5D illustrates another example of the microelectronic structure 100described above with reference to FIG. 5. In the example of FIG. 5D, aface 207 of the microelectronic element 101 may overlie the firstsurface 110 of the substrate 102 instead of overlying the oppositelyfacing second surface 108, as in the above example. In this case, firstand second sets 114, 124 of the first terminals 104 can be positionedoutside of the area of the microelectronic element 101. As further seenin FIG. 5D, the first terminals 104 including the joining elements 130of the microelectronic structure 100 provide sufficient height H1 toaccommodate the height H2 of the microelectronic element 101 to permitthe terminals to be aligned and joined with corresponding contacts 92exposed at a surface 95 of a circuit panel 90. As shown in the exampleof FIG. 5E, a second microelectronic structure 100B can have firstterminals 104 joined to corresponding sets 314, 316 of terminals exposedat the second surface 108 of a first microelectronic structure 100A, soas to form a vertically stacked assembly of the first and secondmicroelectronic structures 100A, 100B.

In another example, as illustrated in FIG. 5F, a microelectronicstructure or package 220, having an organization as discussed aboverelative to FIG. 5, is shown disposed vertically above themicroelectronic structure 100 as described above relative to FIG. 5D.Terminals 222 of microelectronic structure 220 may be as shown anddescribed above in FIGS. 5, 5A for the terminals, e.g., first terminals104 and second terminals 106 of the microelectronic structure 100. Theterminals 222 can be aligned and joined with or otherwise electricallyinterconnected with terminals 314, 316 exposed at the second surface 108of the microelectronic structure 100 below.

FIG. 5G illustrates a specific example of a microelectronic structure asalso shown and described in FIG. 26C of commonly owned U.S. applicationSer. No. 13/439,317, the disclosure of which is incorporated byreference herein. Specifically, the microelectronic structure 230 shownin FIG. 5G can include a microelectronic element 231 having contacts 232on a face 237 thereof which faces in the same direction as the face 201of the microelectronic structure 230 at which first terminals 104 areexposed. The contacts 232 can be electrically connected withcorresponding substrate contacts 234, such as by electrically conductivejoining elements such as bumps, posts or micropillars, or combinationthereof, for example, as indicated at 236.

In one example, the microelectronic structures having a ball-out, i.e.,terminal configuration, such as represented in FIG. 5A, can be used formicroelectronic structures which include microelectronic elements whichoperate according to the industry standard DDR3 or DDR4 specification.

FIG. 5H illustrates a terminal configuration for a microelectronicstructure according to a variation of the embodiment of the inventionillustrate in FIGS. 5, 5A and 5B. The variation of FIG. 5H illustratesanother way in which symmetry can be provided between a first set 242 offirst terminals disposed on a first side 241 of a theoretical plane 132of the microelectronic structure 240, and a second set 244 of the firstterminals disposed on the second side 243 of the theoretical plane. Inthis example, as in the above examples, each of the first and secondsets of first terminals can be configured to carry address informationsufficient to specify a location within the memory storage array. Insome cases, each set 242, 244 may carry only a majority of the addressinformation needed to specify a location within the memory storagearray.

In an example as shown in FIG. 5H, there can be a set of no-connectterminals on each side of the theoretical plane which may not be neededto transfer address information to the address inputs of one or morememory storage arrays in the microelectronic structure. As used herein,a “no-connect terminal” of a microelectronic structure means a terminalwhich is not connected in any electrical path, e.g., path for conductinginformation to any microelectronic element, e.g., semiconductor chip,within the microelectronic structure, whether or not there is ever anyinformation present on such no-connect terminal. Thus, even ifinformation may be present on a no-connect terminal such as may becoupled thereto from another component external to the microelectronicstructure that is connected to the no-connect terminal, the informationpresent on the no-connect terminal is not in any path to be provided toany microelectronic element within the microelectronic structure.

In this case, the position of each first terminal on the first side canbe symmetric about the theoretical plane 132 with a position of ano-connect terminal on the second side of the plane 132, and theposition of each first terminal on the second side is symmetric aboutthe theoretical plane with a position of a no-connect terminal on thefirst side. Thus, as seen in FIG. 5H, the position of each firstterminal in a set of first terminals on a first side 241 of the plane,indicated as Field0 (242), for example, is symmetric about thetheoretical plane 132 with the position of a no-connect terminal in aset of no-connect terminals disposed on the second side 243 of the plane132, indicated as Field0(NC). Also, in FIG. 5H, the position of eachfirst terminal in a set thereof on a second side 243 of the plane 132,indicated as Field1 (244), is symmetric about the theoretical plane 132with the position of a no-connect terminal in a set of no-connectterminals disposed on the first side 241 of the plane, indicated asField1(NC).

The set of first terminals and the set of no-connect terminals on thesame side (e.g., the first side 241) of the plane can be disposed at anysuitable positions so long as the above-described requirements forsymmetry between first terminals on a side and the no-connect terminalson the side opposite thereto are met. The space in which the set offirst terminals on a side of the plane 132 are disposed need not becontiguous. The space in which the set of no-connect terminals on a sideof the plane 132 are disposed also need not be contiguous. Thus, thepositions of the set of first terminals indicated as of Field0(242) andthe set of no-connect terminals indicated as Field1(NC) on the samefirst side 241 of the theoretical plane need not occupy non-overlappingareas of the surface of the structure, i.e., the positions of the firstterminals in the set thereof on the first side 241 can be disposed atany suitable positions relative to the no-connect terminals on the firstside 241, including being intermixed with one another. Moreover, thesame relationship can apply to first terminals and no-connect terminalson the second side of the plane 132 as well. Indeed, in one example,each of the terminals and each of the no-connect terminals on a side ofthe plane may be disposed at any positions in a common grid.

Positions of second terminals of a microelectronic structure accordingto FIG. 5H, in one example, can be as further seen in FIG. 5H. In thiscase, sets 246, 248, 250, and 252 of the second terminals can be asdescribed above relative to FIGS. 5, 5A and 5B, or as further shown anddescribed herein.

In one example, the microelectronic structures having a ball-out, i.e.,terminal configuration such as represented in FIG. 5H can be used formicroelectronic structures which include microelectronic elementscompliant with the industry standard LPDDR3 specification.

FIG. 7A illustrates an assembly 200 of first and second microelectronicpackages 100A, 100B, as mounted to opposite first and second surfaces150, 152 of a circuit panel 154. Although microelectronic structureshaving a specific internal structure are shown, in some examples, eachmicroelectronic structure 100 may be as shown and described above withreference to any of FIG. 5, 5A, 5A-C, 5D, 5E, 5F or 5G or as otherwiseshown and described herein. Each microelectronic structure 100A may havethe same internal structure as the microelectronic structure 100Bmounted opposite thereto, or the microelectronic structure 100A may havea different internal structure from the other microelectronic structure100B. The circuit panel can be of various types, such as a printedcircuit board used in a dual-inline memory module (“DIMM”) module, acircuit board or panel to be connected with other components in asystem, or a motherboard, among others. The first and secondmicroelectronic structures 100A, 100B can be mounted to correspondingcontacts 160, 162 exposed at the first and second surfaces 150, 152 ofthe circuit panel 154, respectively.

As particularly shown in FIG. 7A, because the signal assignments of thefirst terminals in the second grid of each package are a mirror image ofthe signal assignments of the first terminals in the first grid of eachpackage, when the packages 100A, 100B are mounted to the circuit panelopposite one another, each first terminal in the first grid 114A of thefirst package 100A can be aligned with the corresponding first terminalin the second grid 124B of the second package 100B which has the samesignal assignment and to which it is electrically connected. Moreover,each first terminal in the second grid 124A of the first package 100Acan be aligned with the corresponding first terminal in the first grid114B which has the same signal assignment and to which it iselectrically connected.

To be sure, the alignment of each pair of connected terminals can bewithin a tolerance, such that each pair of connected terminals can bealigned within one ball pitch of one another in orthogonal x and ydirections along the first surface 150 of the circuit panel 154. Asevident from FIG. 7A, the first terminals of each grid can be alignedwithin one ball pitch of one another in x and y orthogonal directionsparallel to the surface 350 of the circuit panel, the ball pitch beingno greater than a minimum pitch between any two adjacent parallelcolumns of the terminals on either package. In a particular example, thegrids may be aligned with one another in the x and y directions suchthat at least some of the first terminals on the first and secondmicroelectronic packages are coincident with one another. As usedherein, when the first terminals of packages at opposite surfaces of acircuit panel are “coincident” with one another, the alignment can bewithin customary manufacturing tolerances or can be within a toleranceof less than one-half of one ball pitch of one another in x and yorthogonal directions parallel to the first and second circuit panelsurfaces, the ball pitch being as described above.

In a particular example, at least half of the positions of the alignedgrids of the respective first and second packages 100A, 100B (e.g., thefirst grid 114A of the first package and the second grid 124B of thesecond package) can be aligned with one another in orthogonal x and ydirections along the first surface 150 of the circuit panel 154.

Thus, as further shown in FIG. 7A, a particular first terminal thatcarries a signal marked “A” in grid 114A of the first package 100A isaligned with the corresponding first terminal of grid 124B of the secondpackage 100B that carries the same signal “A”. The same is also trueregarding a particular first terminal that carries a signal marked “A”in grid 124A of the first package 100A that is aligned with thecorresponding first terminal of grid 114B of the second package 100Bthat carries the same signal “A”.

In this way, as further seen in FIG. 7A, the lengths of the electricalconnections through the circuit panel between each pair of electricallyconnected first terminals of the first and second packages 100A, 100Bcan be significantly reduced, in that the terminals in each of thesepairs of electrically connected second terminals may overlie oneanother, or at least be aligned within one ball pitch of one another.The reductions in the lengths of these electrical connections can reducestub lengths in the circuit panel and the assembly, which can helpimprove the electrical performance, such as reducing settling time,ringing, jitter, or intersymbol interference, among others, for theabove-noted signals which are carried by the first terminals and whichare transferred to microelectronic elements in both the first and secondpackages. Moreover, it may be possible to obtain other benefits as well,such as simplifying the structure of the circuit panel or reducing thecomplexity and cost of designing or manufacturing the circuit panel.

As further shown in FIG. 7A, when the second terminals of each package100A, 100B are arranged in third and fourth grids having the specificmirror image arrangement described above with respect to FIGS. 5, 5A-C,for example, each terminal of each package's third grid can be alignedwith the corresponding second terminal of the other package's fourthgrid which has the same signal assignment and to which it iselectrically connected. Thus, as seen in FIG. 7A, each terminal in thethird grid 116A of the first package 100A can be aligned within one ballpitch of the corresponding terminal in the fourth grid 126B of thesecond package 100B which has the same signal assignment and to which itis electrically connected. Moreover, each terminal in the grid 126A ofthe first package 100A can be aligned within one ball pitch of thecorresponding terminal in the third grid 116B which has the same signalassignment and to which it is electrically connected. Again, thealignment of each pair of connected terminals is within a tolerance,such that each pair of connected terminals can be aligned within oneball pitch of one another in orthogonal x and y directions along thefirst surface 150 of the circuit panel 154. In a particular embodiment,the alignment can be such that the corresponding connected terminals ofthe packages 100A, 100B are coincident with one another.

Thus, as further shown in FIG. 7A, a particular first terminal thatcarries a signal marked “B” in grid 116A of the first package 100A canbe aligned within one ball pitch of the corresponding first terminal ofgrid 126B of the second package 100B that carries the same signal “B”and to which it is electrically connected. The same is also trueregarding a particular first terminal that carries a signal marked “B”in grid 126A of the first package 100A that can be aligned within oneball pitch of the corresponding first terminal of grid 116B of thesecond package 100B that carries the same signal “B” and to which it iselectrically connected.

Similar to the connections between corresponding first terminals 104 offirst and second packages as described above, in this embodiment, thelengths of the electrical connections through the circuit panel betweenpairs of electrically connected second terminals 106 of the first andsecond packages can be significantly reduced, in that the terminals ineach of these pairs of electrically connected second terminals may becoincident with one another, or at least be aligned within one ballpitch of one another in orthogonal x and y directions parallel to thecircuit panel surface. Moreover, benefits similar to those describedabove for reducing stub lengths and simplifying the construction of acircuit panel for the connections between the first and second packagesmay be obtained when the second terminals of a microelectronic packageare arranged in this way, i.e., terminals which can be assigned to carrysignals other than the above-noted signals of the command-address bus.

FIG. 7B further illustrates that two pairs 100A-100B, or a greaternumber of pairs of microelectronic packages each having a constructioneither as described above or hereinafter can be electricallyinterconnected with respective panel contacts on a circuit panel 354,e.g., a board of a dual-inline memory module (“DIMM”), in similarorientations as packages 100A, 100B. Thus, FIG. 7B shows three pairs ofpackages 100A-100B, each pair electrically interconnected with circuitpanel 354 in opposite orientations facing one another as describedabove.

FIG. 7B illustrates a microelectronic assembly such as, for example, aDIMM, among others, incorporating a circuit panel and a plurality ofmicroelectronic packages mounted opposite one another to first andsecond opposite surfaces thereof. As seen in FIG. 7B, the above-notedaddress information or in some cases, command-address bus signals can berouted on a bus 36, e.g., an address bus or command-address bus on thecircuit panel or circuit board 354, in at least one direction 143between connection sites I, II or III at which respective pairs ofmicroelectronic packages 100A-100B are connected to opposite sides ofthe circuit panel. Signals of such bus 36 reach each pair of packages atthe respective connection sites I, II or III at slightly differenttimes. The at least one direction 143 can be transverse to or orthogonalto a direction 142 in which at least one column 111 of a plurality ofcontacts on at least one microelectronic element within each package100A or 100B extends. In such way, the signal conductors of the bus 36on (i.e., on or within) the circuit panel 354 can in some cases bespaced apart from one another in a direction 142 which is parallel tothe at least one column 111 of contacts on a microelectronic elementwithin a package 100A, or 100B connected to the circuit panel.

Such a configuration, particularly when the terminals of the first grid104 of each microelectronic package are arranged in one or more columnsextending in such direction 142, may help simplify the routing of signalconductors of one or more global routing layers on the circuit panelused to route the signals of the bus 36. For example, it may be possibleto simplify routing of the command-address bus signals on a circuitpanel when relatively few first terminals are disposed at the samevertical layout position on each package. Thus, in the example shown inFIG. 5C, the first and second grids 114, 124 of each package have onlyfour terminals disposed at the same vertical layout position, such as,for example, the terminals of the first and second grids 114, 124configured to receive address signals A3 and A1, as further shown inFIG. 5A.

In one embodiment, the microelectronic assembly 354 can have amicroelectronic element 358 that can include a semiconductor chipconfigured to perform buffering of at least some signals transferred tothe microelectronic packages 100A, 100B of the assembly 354. Such amicroelectronic element 358 having a buffering function can beconfigured to help provide impedance isolation for each of themicroelectronic elements in the microelectronic packages 100A and 100Bwith respect to components external to the microelectronic assembly 354.

In an exemplary embodiment, the microelectronic assembly 354 can have amicroelectronic element 358 that can include a semiconductor chipconfigured predominantly to perform a logic function, such as a solidstate drive controller, and one or more of the microelectronic elementsin the microelectronic packages 100A and 100B can each include memorystorage elements such as nonvolatile flash memory. The microelectronicelement 358 can include a special purpose processor that is configuredto relieve a central processing unit of a system such as the system 2500(FIG. 31) from supervision of transfers of data to and from the memorystorage elements included in the microelectronic elements. Such amicroelectronic element 354 including a solid state drive controller canprovide direct memory access to and from a data bus on a motherboard(e.g., the circuit panel 2502 shown in FIG. 31) of a system such as thesystem 2500.

In such an embodiment of the microelectronic assembly 354 having amicroelectronic element 358 that includes a controller function and/or abuffering function, the command-address bus signals can be routedbetween the microelectronic element 358 and each pair of packages 100Aand 100B at respective connection sites I, II or III. In the particularexample shown in FIG. 7B, a portion of the command-address bus 36 thatextends past the connection sites I, II or III can extend in thedirection 143 or in another direction transverse to the direction 143 toreach contacts of the microelectronic element 358. In one embodiment,the command-address bus 36 can extend in the direction 143 to reachcontacts of the microelectronic element 358.

FIG. 8 illustrates a microelectronic package 200 according to avariation of the embodiment described above relative to FIGS. 5A-7A inwhich a microelectronic element has a composite structure which includesfirst and second semiconductor chips 101A, 101B. The secondsemiconductor chip 101B, like the first semiconductor chip, also haselement contacts 111B, 113B on its front face 105 which are electricallyconnected with the substrate contacts 121, 123. In a particularembodiment, a spacer element 103 can be disposed between the front face105 of the first semiconductor chip and the rear face 107 of the secondsemiconductor chip, which can facilitate forming wire bonds 112connected to the first semiconductor chip 101A at a stage of processingafter the second semiconductor chip 101B has been stacked with thespacer element 103 atop the first semiconductor chip.

FIG. 9 illustrates another variation of the embodiment shown in FIG. 8in which the microelectronic element further includes anothersemiconductor chip 109 disposed between the second surface 108 of thesubstrate and the rear face 107 of the first semiconductor chip 101A.Semiconductor chip 109 can have contacts 129 on a front face 125 thereofwhich face corresponding contacts 115, 117 and are joined thereto. Thejoints between the chip 109 and the corresponding substrate contacts115, 117 can be made using electrically conductive joining elements 118,which can include a bond metal, a deposited electrically conductivematerial, posts or pillars of a metal, e.g., a rigid metal such ascopper, nickel or combination thereof. In a particular example, thesemiconductor chip 109 can be a bare chip, i.e., unpackaged chip.Alternatively, the semiconductor chip 109 may include conductivestructure such as leads, traces, or vias thereon, among others, or maybe a packaged semiconductor element.

When the microelectronic package includes a vertically stackedarrangement of semiconductor chips such as seen in FIG. 8 or FIG. 9, oras seen in examples described in the following, one or more of the chipswithin the package can be configured, e.g., designed, constructed, orset up, to buffer signals or otherwise regenerate information receivedat the terminals 104 or 106 of the package, or both such terminals, fortransfer to another semiconductor chip within the package. For example,in a configuration as shown in FIG. 8, a first semiconductor chip 101Aadjacent the substrate can buffer or otherwise regenerate one or moresignals or information for transfer to the second semiconductor chip. Ina configuration as seen in FIG. 9, a semiconductor chip 109 can buffersignals or otherwise regenerate information for transfer to one or moreof semiconductor chips 101A, 101B. Alternatively or in addition thereto,semiconductor chip 109 can regenerate signals received from one or moreof the semiconductor chips 101A, 101B for transfer to the terminals 104,106 or both 104, 106, or can regenerate signals being transferred inboth directions from the terminals to the semiconductor chips 101A,101B; or signals being transferred from the semiconductor chips 101A,101B to the terminals of the microelectronic package.

Alternatively or in addition to regenerating signals as described above,in one example, the first chip in such a composite microelectronicelement can be configured to partially or fully decode information thatcontrols an operating mode of the microelectronic element. In aparticular example, the first semiconductor chip in such compositemicroelectronic element can be configured to partially or fully decodeat least one of address information or command information received atthe terminals, such as at the first terminals of the microelectronicpackage. The first chip can then output the result of such partial orfull decoding for transfer to the one or more second semiconductor chips101A, 101B.

Signals or information received at the terminals of the package can berouted to substrate contacts 115 and through joining elements 118 tosemiconductor chip 109. Semiconductor chip 109 can then regenerate andtransfer the received signals or information to substrate contacts 117.From the substrate contacts 117, the signals or information may berouted by the substrate, such as through conductive traces thereon tosubstrate contacts 111, 113 where they are then routed to thesemiconductor chips 101A, 101B such as through wirebonds 112. In aparticular example, the semiconductor chip 109 can be configured tobuffer the above-noted command signals, address signals and clocksignals transferred to the semiconductor chips 101A, 101B.

FIG. 10 illustrates a microelectronic package 600 according to aparticular example in which the microelectronic element includes avertical stack 630 of an electrically interconnected first semiconductorchip 632 and a plurality of second semiconductor chips 634, each havinga contact-bearing face 631 that faces away from the substrate 602. Wirebonds 635 electrically interconnect the contacts 626 on thesemiconductor chips 632, 634 with corresponding contacts 636 on thesubstrate. Spacers 638 can be disposed between adjacent faces of thesemiconductor chips 634, and a spacer 638 can be disposed between thecontact-bearing face 631 of the semiconductor chip 632 and a rear faceof semiconductor chip 634. In some cases, adhesive layers (not shown)can be provided between each spacer and the faces of the semiconductorchips adjacent to such spacer. As shown in FIG. 10, the one or moresecond semiconductor chips 634 are electrically interconnected with thefirst semiconductor chip 632. For example, as seen in FIG. 10, there arethree vertically stacked second semiconductor chips 634 in which thefaces 631 thereof are parallel to one another.

In the microelectronic package 600 seen in FIG. 10, each of the firstand second semiconductor chips 632, 634 can be configured such that eachsuch semiconductor chip embodies a greater number of active devices toprovide memory storage array function than any other function. Forexample, each of the first and second semiconductor chips may include amemory storage array and all circuitry required for inputting data toand outputting data from the memory storage array. For example, when thememory storage array in each semiconductor chip is writable, each of thesemiconductor chips may include circuitry configured to receive externaldata input from terminals of the package, as well as circuitryconfigured to transfer data output from such semiconductor chip toterminals of the package. Thus, each first and each second semiconductorchip 632, 634 can be a dynamic random access memory (“DRAM”) chip orother memory chip which is capable of inputting and outputting data fromthe memory storage array within such semiconductor chip and receivingand transmitting such data to a component external to themicroelectronic package. Stated another way, in such case, signals toand from the memory storage array within each DRAM chip or other memorychip does not require buffering by an additional semiconductor chipwithin the microelectronic package.

Alternatively, in another example, the one or more second semiconductorchips 634 may embody a greater number of active devices to providememory storage array function than any other function, but the firstsemiconductor chip 632 may be a different type of chip. In this case,the first semiconductor chip 632 can be configured, e.g., designed,constructed, or set up, to buffer signals, i.e., regenerate signalsreceived at the terminals for transfer to the one or more secondsemiconductor chips 634, or to regenerate signals received from one ormore of the second semiconductor chips 634 for transfer to theterminals, or to regenerate signals being transferred in both directionsfrom the terminals to the one or more second semiconductor chips 634;and from the one or more semiconductor chips to the terminals of themicroelectronic package.

In a particular example, the first semiconductor chip can be configuredto buffer address information or may be configured to buffer commandsignals, address signals and clock signals which are transferred to theone or more second semiconductor chips. For example, the firstsemiconductor chip 632 can be a buffer chip which embodies a greaternumber of active devices to provide a buffering function in transferringsignals to other devices, e.g., to the one or more second semiconductorchips 634, than for any other function. Then, the one or more secondsemiconductor chips may be reduced function chips which have memorystorage arrays but which can omit circuitry common to DRAM chips, suchas buffer circuitry, decoders or predecoders or wordline drivers, amongothers. In that case, the first chip 632 may function as a “master” chipin the stack and to control operations in each of the secondsemiconductor chips 634. In a particular example, the secondsemiconductor chips may be configured such that they are not capable ofperforming the buffering function, and so the stacked arrangement of thefirst and second semiconductor chips is configured such that thebuffering function required in the microelectronic package can beperformed by the first semiconductor chip, and cannot be performed byany of the second semiconductor chips in the stacked arrangement.Similar to that described above, the first semiconductor chip may beconfigured to partially or fully decode information received at thefirst terminals that controls an operating mode of the microelectronicelement made up of the first and second semiconductor chips.Alternatively, or in addition thereto, the first semiconductor chip maybe configured to partially or fully decode at least one of address orcommand information received at the first terminals. In a particularexample, one or more of the second semiconductor chips may not beconfigured to fully decode information received at the first terminalsof the microelectronic package, such as address information, commandinformation or information that controls an operating mode of themicroelectronic element.

In any of the embodiments described herein, the one or more secondsemiconductor chips can be implemented in one or more of the followingtechnologies: DRAM, NAND flash memory, RRAM (“resistive RAM” or“resistive random access memory”), phase-change memory (“PCM”),magnetoresistive random access memory, e.g. such as may embodimenttunnel junction devices, spin-torque RAM, or content-addressable memory,among others.

FIG. 11 is a sectional view and FIG. 12 is a corresponding plan viewillustrating a microelectronic package 660 according to a furthervariation in which the second semiconductor chips 634 are mounted instair-step manner relative to one another such that the contacts of thefirst semiconductor chip 632 are exposed beyond an edge 618 of thesecond semiconductor chip 634A immediately above the first semiconductorchip 632, and the contacts of that semiconductor chip 634A are exposedbeyond an edge 618 of the second semiconductor chip 634B immediatelyabove that second semiconductor chip. Electrical connections between thefirst and second chips and the substrate and among the chips can beprovided by wire bonds 635 which electrically connect adjacent chipswithin the stack of semiconductor chips, or wire bonds 637 whichelectrically connect the chips directly to the package substrate 662.

FIG. 13 illustrates a microelectronic package 670 according to a furthervariation of the embodiment described above relative to FIG. 10, inwhich connections between contacts of the one or more secondsemiconductor chips 634 can include traces or leads 640 which extendalong one or more edges of a unit of stacked semiconductor chips 630,i.e., along edges of the semiconductor chips 634 within such unit 630.Unit 630 may be mounted and electrically interconnected with contacts627 of the first semiconductor chip 632, such as with a bond metal,e.g., solder, tin, gold, indium, a eutectic, or electrically conductivebumps, or both, which may in some cases include conductive posts, e.g.,micropillars. Traces 654 may extend along a face 631 of the firstsemiconductor chip from the contacts 627 to second contacts 626, whichin turn can be electrically connected with the substrate 602, such asthrough wire bonds 645.

The electrical connections between the second semiconductor chips 634may further include traces 644 which extend along front faces of thesecond semiconductor chips 634. As further shown in FIG. 13, the frontfaces 642 of the second semiconductor chips may face upwardly away fromthe substrate 602 or downwardly towards the substrate 602.

FIG. 14 further illustrates a microelectronic package 680 in which asecond semiconductor chip 634 has contacts 647 facing contacts 627 ofthe first chip and joined thereto in flip-chip manner, such as through abond metal, e.g., solder, tin, gold, indium, a eutectic, or electricallyconductive bumps, or both. Traces 654 may electrically connect thecontacts 627 with other contacts 626 on the first chip which areelectrically connected to the substrate, such as through wire bonds 645.

FIG. 15A further illustrates a microelectronic package 690 according toa particular example in which the one or more second semiconductor chips634 are electrically connected with one another by through-silicon-vias(“TSVs”) 650 which extend in a direction of the thicknesses 652 of atleast some of the second semiconductor chips 634, i.e., in a directionnormal to the faces 642 of the chips 634. As seen in FIG. 15A, in oneexample, the TSVs 650 can be electrically connected with contacts 627 ofthe first semiconductor chip 632, such as through a bond metal, e.g.,solder, tin, gold, indium, a eutectic, or electrically conductive bumps,or both, which may in some cases include conductive posts, e.g.,micropillars. Traces 654 may extend along a face 631 of the firstsemiconductor chip from the contacts 627 to second contacts 626, whichin turn can be electrically connected with the substrate through wirebonds 645.

In one example, information or signals received at terminals of thepackage 690, such as at the first terminals, the second terminals, orboth, can be received by the first semiconductor chip 632 through wirebonds 645 which are joined to substrate contacts 636, which in turn arejoined to such terminals of the microelectronic package. The firstsemiconductor chip 632, operating as a buffer element, can thenregenerate the received information or signals and then transfer theregenerated information or signals to the one or more secondsemiconductor chips, e.g., through the connections between the first andsecond chips 632, 634 and through the TSVs 650 within the stack ofsecond chips 634. In one example, the first semiconductor may at leastone of regenerate or partially or fully decode the address informationfor transfer thereof to the one or more second semiconductor chips 634in the microelectronic structure.

FIG. 15B illustrates a variation of the microelectronic package shown inFIG. 15A. Unlike the package shown in FIG. 15A, semiconductor chip 664,which is configured to at least one of regenerate or partially or fullydecode address information or other information, e.g., regeneratesignals for transfer to other semiconductor chips in the package, is notlocated adjacent to the second surface 108 of the substrate 602. Rather,in this case, the semiconductor chip 664 can be disposed at a positionwithin the package that overlies one or more other semiconductor chips.For example, as shown in FIG. 15B, chip 664 at least partially overliessemiconductor chip 662 that is disposed adjacent to the second surface108 of the substrate 602 and chip 664 at least partially overliessemiconductor chips 663A, 663B and 663C which are disposed atopsemiconductor chip 662. In one example, semiconductor chips 662 and663A, 663B and 663C may include memory storage arrays. As in theexamples described above, such chips 662, and 663A, 663B and 663C mayeach incorporate circuits configured to buffer, e.g., temporarily store,data that is to be written to such chip, or data that is being read fromsuch chip, or both. Alternatively, the chips 662, and 663A, 663B and663C may be more limited in function and may need to be used togetherwith at least one other chip which is configured to temporarily storedata that is to be written to such chip or data that is being read fromsuch chip, or both.

Semiconductor chip 664 can be electrically connected to terminals of themicroelectronic package, e.g., to sets of first terminals 604 and setsof the second terminals 606, through electrically conductive structure,e.g., wire bonds 665, which partially overlies a front face 631 ofsemiconductor chip 663A and which connects to contacts 636 exposed atthe second surface 108 of the substrate. The electrically conductivestructure, e.g., wire bonds 665, can electrically connect tosemiconductor chip 664 through contacts 638 on a chip 663A and throughconductors (not shown) which extend along the face 631 of chip 663A oralong confronting face 641 of chip 664, or which conductors extend alongthe faces 631, 641 of both of the chips 663A, 664. As indicated above,semiconductor chip 664 may be configured to at least one of regenerateor at least partially decode signals or information that it receivesthrough the conductive structure, e.g., wire bonds 665, and in suchcase, may be configured to transfer the regenerated or at leastpartially decoded signals or information to other chips within thepackage such as to chips 662, and 663A, 663B and 663C.

As further seen in FIG. 15B, semiconductor chips 662, 663A, 663B and663C can be electrically connected to semiconductor chip 664 and to oneanother by a plurality of through silicon vias 672, 674 and 676 whichcan extend through one, two or three or more of such chips. Each suchthrough silicon via may electrically connect with wiring, e.g.,conductive pads or traces of two or more of the semiconductor chips 662,663A, 663B and 663C and 664 within the package. In a particular example(not shown), through silicon vias may extend through the thicknesses ofall semiconductor chips 662, 663A, 663B and 663C, even though eachthrough silicon via may not electrically connect with each suchsemiconductor chip through which it extends.

As further seen in FIG. 15B, a heat sink or heat spreader 668, which mayinclude a plurality of fins 671, can be thermally coupled to a face ofsemiconductor chip 664, e.g., a rear face 633 thereof, such as through athermally conductive material 669 such as thermal adhesive, thermallyconductive grease, or solder, among others.

The microelectronic assembly 695 shown in FIG. 15B may be configured tooperate as a memory module capable of transferring a designated numberof data bits per cycle onto or off of the microelectronic packagethrough the first and second terminals provided therefor on thesubstrate. For example, the microelectronic assembly may be configuredto transfer a number of data bits such as thirty-two data bits,sixty-four data bits, or ninety-six data bits, among other possibleconfigurations, to or from an external component such as a circuit panelwhich can be electrically connected with terminals 604, 606. In anotherexample, when the bits transferred to and from the package include errorcorrection code bits, the number of bits transferred per cycle to orfrom the package may be thirty-six bits, seventy-two bits or one hundredeight bits. Other data widths are possible than those which arespecifically described here.

FIGS. 16-18 illustrate a further microelectronic structure 1400according to another embodiment of the invention in which themicroelectronic structure can include first and second microelectronicelements 1401, 1403 having edges which are spaced apart from one anotherin a direction 1435 parallel to the first surface 1410 of the package.Microelectronic elements within the microelectronic structure may haveany orientation or electrical interconnection with the terminals such asthat shown and described above with respect to any of the foregoingdescription and figures except that there are now at least twomicroelectronic elements 1401, 1403 within the microelectronic structurein the example shown in FIGS. 16-18.

As seen in FIG. 16, the first terminals on the package are disposed infirst and second sets at locations on opposite sides of a theoreticalplane 1432, in which the first terminals in each set thereof may bedisposed at locations within grids 1414, 1424 on respective sides. Thefirst terminals in each of the first and second sets may have signalassignments which are a mirror image of the signal assignments of thefirst terminals on the side of the theoretical plane opposite thereto asdescribed above. As in the above-described embodiments, in someexamples, the sets 1414, 1424 of first terminals can be disposed infirst and second parallel grids each grid being configured to carry theabove-noted address information for receipt by the address inputs forspecifying a location within the memory storage array of themicroelectronic structure. As in the above-described embodiments, eachset of first terminals can be configured to carry sufficient addressinformation to uniquely specify a storage location within the memorystorage array.

In a particular embodiment, the first terminals in each grid can beconfigured to carry all of a group of the command-address bus signals:i.e., command signals, address signals, bank address signals and clocksignals which are transferred to the microelectronic package, whereinthe command signals include write enable, row address strobe, and columnaddress strobe signals, and the clock signals can be used for samplingthe address signals. The terminals in the grids 1414, 1424 areelectrically connected with corresponding contacts of themicroelectronic elements 1401, 1403 within the package 1400 and eachgrid is constructed to conduct all of the above-noted signals of thecommand-address bus to a microelectronic element within the package. Inaddition, as specifically shown in FIG. 16, and as further describedbelow, the signal assignments of the terminals in the first grid 1414are a mirror image of the signal assignments of the terminals in thesecond grid 1424.

Providing duplicate sets of first terminals in first and second sets,e.g., parallel grids in which the signal assignments in one grid are amirror image of the signal assignments in the other grid can help reducethe lengths of stubs in an assembly of first and second microelectronicpackages mounted opposite one another to a circuit panel. When first andsecond microelectronic packages are connected to opposite mountingsurfaces of a circuit panel with the circuit panel electricallyinterconnecting the packages, each of the first terminals of the firstmicroelectronic structure, or package can be aligned within one ballpitch of the corresponding first terminal of the second, mirror imageset of the second microelectronic structure package to which it iselectrically connected. In addition, each of the first terminals of thefirst set or grid of the second microelectronic structure or package canbe so aligned within one ball pitch of the corresponding first terminalsof the second, mirror image set or grid of the first microelectronicstructure or package to which it is electrically connected. As a result,each first terminal of the first structure or package can beelectrically connected with a corresponding first terminal of the secondstructure or package, with the mounting locations of each pair ofterminals on the opposite circuit panel surfaces being within one ballpitch of each other in orthogonal x and y directions parallel to one ofthe surfaces of the circuit panel. In some cases, the mounting locationsof each pair of connected terminals on the opposite circuit panelsurfaces may even be coincident with one another. Accordingly, thelengths of the electrical connections through the circuit panel betweenpairs of electrically connected first terminals of the first and secondpackages can be significantly reduced, in that the terminals in each ofthese pairs of electrically connected first terminals may be coincidentwith one another, or otherwise aligned within one ball pitch of oneanother in x and y orthogonal directions along the first circuit panelsurface.

The circuit panel construction may also be simplified in an assemblyhaving this construction because the routing between each electricallyconnected pair of first terminals can be mostly in a vertical direction,i.e., in a direction through the thickness of the circuit panel. Thatis, via connections on the circuit panel may be all that is needed toelectrically connect each pair of corresponding first terminals of thepackages mounted to the opposite surfaces of the circuit panel.

Another feature of the microelectronic structure 1400 can be understoodwith reference to FIGS. 16-20 and also each of the structures depictedin FIGS. 21-30 which have at least first and second microelectronicelements 1401, 1403 spaced apart from one another in a directionparallel to the first surface 1410 of the microelectronic structure(FIG. 17). In such case, the memory storage array can comprise first andsecond memory storage arrays. In such microelectronic structure 1400, ascan be understood from FIG. 19, a structure 1400A can be configured toprovide address information on a first set, e.g., grid 1414A of firstterminals thereof to address inputs of a first microelectronic element1401A having the first memory storage array therein, without beingconfigured to provide address information on the first set e.g., grid1414A, of first terminals to address inputs of the secondmicroelectronic element 1403A having the second memory storage arraytherein. Similarly, the structure 1400A can be configured to provideaddress information on a second set, e.g., grid 1424A of first terminalsthereof to address inputs of the second microelectronic element 1403Atherein, without being configured to provide address information on thesecond set, e.g., grid 1424A, of first terminals to the firstmicroelectronic element 1401A.

This concept can also be implemented in microelectronic structures whichinclude greater numbers of microelectronic elements. Thus, amicroelectronic structure 1400A can be configured to provide addressinformation received on a first set, e.g., grid 1414A of first terminalsthereof to address inputs of two or more microelectronic elementstherein, while not provided the address information received on thesecond set of first terminals to those two or more microelectronicelements. Conversely, the structure can be configured to provide addressinformation received on a first set, e.g., grid 1414A of first terminalsthereof to address inputs of two or more microelectronic elementstherein, while not provided the address information received on thesecond set of first terminals to those two or more microelectronicelements.

In addition, such organization within the microelectronic structure inwhich the first and second sets of first terminals are configured totransfer at least address information to each of first and secondmicroelectronic elements, respectively, can facilitate themicroelectronic structure to provide more than one rank of memory accesstherein. Specifically, the receipt of different address information bythe microelectronic structure through the first and second sets of firstterminals facilitates dual ranks of memory access from a singlemicroelectronic structure. In one such example, without limitation, asingle microelectronic structure which incorporates four microelectronicelements each having 16 bit wide data paths may provide dual ranks of32-bit wide memory access. In this way, the microelectronic structurecan be configured to provide dual rank memory access, e.g., such as, forexample, two channel memory access in which each of the first and secondmemory channels may have a data width of N bits, wherein, withoutlimitation, N bits can have a typical data bus width for a memorychannel such as 16 bits, 32 bits, or 64 bits (typically without errordetection or correction bits), or may has a width of 18 bits, 36 bits or72 bits (typical for buses with error detection or correction bits).

Alternatively, when each of the first and second sets of first terminalsare configured to transfer the same address information to each of firstand second microelectronic elements, respectively, the microelectronicstructure in such case may provide a rank of memory access which has arelatively wide data path. Specifically, the receipt of the same addressinformation by the microelectronic structure through each of the firstand second sets of first terminals may facilitate a single rank ofmemory access having a data path which can be twice a width of a datapath of a dual rank access microelectronic structure as described above.In one such example, without limitation, a single microelectronicstructure which incorporates four microelectronic elements each having16 bit wide data paths may provide a single rank of 64-bit wide memoryaccess. Thus, in one example, it is possible that each of the at leasttwo microelectronic elements in any of the microelectronic structures1400 described with reference to FIGS. 16-20 or referring to one or moreof FIGS. 21-30 may function together to provide single rank memoryaccess. In such case, the data bus widths may be greater than in amicroelectronic structure having dual rank memory access. In this case,a memory channel having a data bus width of 2N bits (compared to N bitsfor the dual rank case) can access locations within each of themicroelectronic elements providing memory storage array function in themicroelectronic structure. Moreover, the single rank memory accessprovided by the microelectronic structure may have a data bus width of2N bits, e.g., 32, 64 or 128 bits (without error detection), forexample, may have a data bus width of 2N bits, e.g., 32, 64 or 128 bits(without error detection) or may have a data bus width of 2N bits, e.g.,36, 72 or 144 bits (without error detection).

Moreover, the number of global routing layers of wiring on the circuitpanel required to route the above-noted address information on a bus 36(FIG. 7B) along the circuit panel between connection sites whererespective pairs of microelectronic packages are connected can also bereduced when the microelectronic packages attached thereto areconstructed according to the principles herein. Specifically, the numberof global routing layers required to route such signals along thecircuit panel may in some cases be reduced to two or fewer routinglayers. However, on the circuit panel, there may be a greater number ofglobal routing layers which carry signals other than the above-notedaddress information or signals on a bus 36.

The microelectronic package may also have second terminals other thanthe first terminals, such terminals typically being configured to carrysignals other than the above-noted command-address bus signals. In oneexample, the second terminals can include terminals used for carryinguni-directional or bi-directional data signals to and or from themicroelectronic element, and data strobe signals, as well as data masksand ODT or “on die termination” signals used to turn on or off parallelterminations to termination resistors. Signals or reference potentialssuch as chip select, reset, power supply voltages, e.g., Vdd, Vddq, andground, e.g., Vss and Vssq, may also be carried by the second terminals;none of the signals or reference potentials needs to be carried by thefirst terminals. In some embodiments it is possible for some or allterminals configured to carry signals other than the command-address bussignals to be disposed as second terminals in any locations on thepackage.

Alternatively, in some embodiments it is possible for some or allterminals which are configured to carry signals other than thecommand-address bus signals to also be disposed in the first grid andwithin the second, mirror image grid of first terminals on the package.In this way, it may be possible to reduce the stub lengths in theelectrical connections provided on a circuit panel between thesecorresponding first terminals, as described above.

In other embodiments, some or all of the terminals which are configuredto carry signals other than the command-address bus signals can bearranged as a set of second terminals in a third grid on the packagesurface, and another set of the second terminals can be arranged in afourth grid on the same package surface, in which the signal assignmentsof the second terminals in the third grid are a mirror image of thesignal assignments of the second terminals in the fourth grid. In thisway, similar to the connections between corresponding first terminals offirst and second packages as described above, the lengths of theelectrical connections through the circuit panel between pairs ofelectrically connected second terminals of the first and second packagescan be significantly reduced, in that the terminals in each of thesepairs of electrically connected second terminals may be coincident withone another, or otherwise aligned within one ball pitch of one another.Moreover, benefits similar to those described above for reducing stublengths and simplifying the construction of a circuit panel for theconnections between the first and second packages may be obtained whensecond terminals of a microelectronic package are arranged in this way.

Referring to FIG. 17, the first and second microelectronic elements1401, 1403 may each include a memory storage array defined by activeelements therein, and have address inputs for receipt of addressinformation specifying locations within the storage array. In aparticular example, each of the microelectronic elements 1401, 1403 maybe configured, i.e., constructed to predominantly provide memory storagearray function, in that each of the first and second microelectronicelements 1401, 1403 has a greater number of active devices, such astransistors which are configured to provide memory storage arrayfunction than any other function, as indicated above.

In the particular example shown in FIG. 17, the first and secondmicroelectronic elements 1401, 1403 may have element contacts 1436 atfaces 1431 of the microelectronic elements which face away from thesubstrate 1402 and are electrically connected with correspondingsubstrate contacts 1446 exposed at the second surface 1408 of thesubstrate, as seen in FIG. 17. However, the microelectronic elements canbe oriented differently, which in some cases, may be face-down, suchthat element contacts 1436 may face towards the second surface 1408 ofthe substrate 1402, as in the above-described example of FIG. 5G, and asalso seen in commonly owned U.S. application Ser. No. 13/439,317 thedisclosure of which incorporated by reference herein, particularly FIG.6 et seq. therein.

As seen in FIGS. 16-18, the package 1400 can have first terminals 1414,1424 and second terminals 106 for electrically and mechanicallyconnecting the package 1400 with a component external to the package1400, such as a circuit panel, for example. The terminals can beelectrically conductive pads, posts, or other electrically conductivestructure. In the example seen in FIG. 17, joining elements 1430, whichmay include a bond metal such as solder, tin, indium, gold, or aeutectic material, among others, or other conductive bond material, maybe attached to the first and second grids 1404, 1406 of terminals. Thefirst terminals 1404 and the second terminals 1406 can be electricallyconnected with the substrate contacts 1446 through electricallyconductive structure on the substrate, such as traces and vias, forexample.

An arrangement of the first terminals in the first and second grids1414, 1424 of the package can be as particularly shown in FIG. 16. Inone example, each grid 1414, 1424 may include first and second parallelcolumns 1438 of terminals. The columns 1438 of terminals in each gridcan be adjacent to one other. Alternatively, although not shown in FIG.16, at least one terminal may be disposed between the first and secondcolumns of terminals. As seen in FIG. 16, the signal assignments of thefirst terminals in the second grid 1424 are a mirror image of the signalassignments 1424 of the first terminals in the first grid 1414. Statedanother way, the signal assignments of the first terminals in the firstand second grids are symmetric about an axial plane 1432 which extendsin a direction orthogonal to the surface 1410 of the substrate andintersects the surface 1410 along a line centered between the first andsecond grids 1414, 1424, the axial plane 1432 in this case extending ina direction 1434 in which columns 1438 of the first terminals extend.With the signal assignments in the second grid 1424 being a mirror imageof those in the first grid 1414, a first terminal 1404 of the first grid1414 which is assigned to carry the signal CK (clock) is in the samerelative vertical position (in direction 1434) within the grid as thecorresponding first terminal 1404 of the second grid 1414 which isassigned to carry the signal CK. However, since the first grid 1414contains two columns 1438 and the terminal of the first grid 1414assigned to carry the signal CK is in the left column thereof among thetwo columns 1438 of the first grid. The mirror image signal assignmentrequires that the corresponding terminal of the second grid 1424assigned to carry the signal CK is in the right column 1438 among thetwo columns of the second grid. Another result of this arrangement isthat the terminal assigned to carry the signal WE (write enable) is alsoin the same relative vertical position within the grid in each of thefirst and second grids 1414, 1424. However, in the first grid 1414, theterminal assigned to carry WE is in the right column among the twocolumns 1438 of the first grid, and the mirror image arrangementrequires that the corresponding terminal of the second grid 1424assigned to carry the signal WE is in the left column 1438 among the twocolumns of the second grid 1424. As can be seen in FIG. 16, the samerelationship applies for each first terminal in each of the first andsecond grids, at least for each first terminal assigned to carry acommand-address bus signal as discussed above.

The theoretical, i.e., “axial” plane 1432 about which the signalassignments of the first terminals are symmetric can be located atvarious positions on the substrate. In a particular embodiment, theaxial plane can intersect the surface 1410 of the substrate along a lineon the surface that is located equidistant from first and second opposededges 1440, 1442 of the substrate, particularly when the columns 1438 ofthe first terminals extend in a direction parallel to the edges 1440,1442 and the first and second grids are disposed at locations which aresymmetric about this central axis.

In a particular example, the first terminals 1404 of the first grid 1414can be electrically connected with the first microelectronic element1401, and the first terminals 1404 of the second grid 1424 can beelectrically connected with the second microelectronic element 1403. Insuch case, the first terminals 1404 of the first grid 1414 may also benot electrically connected with the second microelectronic element 1403,and the first terminals 1404 of the second grid 1424 of the package 1400may also be not electrically connected with the first microelectronicelement 1401. In yet another example, the first terminals 1404 of eachof the first and second grids 1414 can be electrically connected witheach of the first and second microelectronic elements 1401, 1403.

As mentioned above, the second terminals 1406 can be configured to carryinformation or signals other than the above-noted address information orsignals of the command-address bus. In one example, the second terminals1406 can include terminals used for carrying uni-directional orbi-directional data signals to and or from the microelectronic element,and data strobe signals, as well as data masks and ODT or “on dietermination” signals used by the chip to turn on or off parallelterminations to termination resistors. Signals such as chip select,reset, clock enable, as well as reference potentials such as powersupply voltages, e.g., Vdd, Vddq, or ground, e.g., Vss and Vssq, can beamong the signals carried by either the first terminals 1404 or thesecond terminals 1406. However, none of these signals or referencepotentials needs to be carried by the first terminals 1404. As furthershown in FIGS. 16-18, second terminals 1406 (Check—only in FIG. 17—addto 16, 18) can be disposed at locations of a third grid 1416 exposed atthe first surface 1410 of the substrate, and another set of the secondterminals can be disposed in a fourth grid 1426 exposed at the firstsurface 1410. In a particular case, the signal assignments of the secondterminals in the third grid 1416 can be a mirror image of the signalassignments of the second terminals in the fourth grid 1426, in likemanner to that described above for the first and second grids. The thirdand fourth grids 1416, 1426 can extend in the direction 1434 in whichthe first and second grids extend and can be parallel to one another.The third and fourth grids may also be parallel to the first and secondgrids 1414, 1424. Alternatively, each of the third and fourth grids1416, 1426 can extend in another direction 1435 which is orthogonal todirection 1434.

As shown in FIG. 17, an encapsulant 1448 may overlie the second surface1408 of the substrate and may contact the microelectronic elements 1401,1403 therein. In some cases, the encapsulant may overlie surfaces 1431of the microelectronic elements 1401, 1403 which face away from thesubstrate 1402.

In a further variation, the first and second microelectronic elements ofthe microelectronic structure may be arranged as shown alternatively incommonly owned U.S. application Ser. No. 13/337,565 (“the '565application”); and Ser. No. 13/440,515 (“the '515 application”), thedisclosures of which are incorporated by reference herein. For example,a substrate of the package may include multiple apertures which may bebond windows in which contacts on a face of the microelectronic elementstherein may face towards the second surface 1408 of the substrate asseen in FIGS. 7A-7B, and FIG. 10B of the '565 and '515 applications, anda contact-bearing front face of a microelectronic element can overlie arear face of another microelectronic element in which each of themicroelectronic elements can incorporate active elements of a memorystorage array. The microelectronic elements in such embodiments can beelectrically interconnected with the terminals of the microelectronicstructure, e.g., a package, as shown and described in either of the '565or '515 applications.

In another variation, the microelectronic structure can include threemicroelectronic elements which can be arranged therein as shown in FIGS.8A-B or FIG. 11 of the '565 or '515 applications.

FIG. 19 illustrates an assembly 1450 of first and second microelectronicpackages 1400A, 1400B, each being a microelectronic package 1400 asdescribed with reference to FIGS. 16-18 above, as mounted to oppositefirst and second surfaces 1460, 1462 of a circuit panel 1464. Thecircuit panel can be of various types, such as a printed circuit boardused in a dual inline memory module (“DIMM”) module, a circuit board orpanel to be connected with other components in a system, or amotherboard, among others. The first and second microelectronic packages1400A, 1400B can be mounted to corresponding contacts 1470, 1472 exposedat the first and second surfaces 1460, 1462 of the circuit panel 1464.

As particularly shown in FIG. 16, because the signal assignments of thefirst terminals in the second grid 1424 of each package are a mirrorimage of the signal assignments of the first terminals in the first grid1414 of each package, when the packages 1400A, 1400B are mounted to thecircuit panel opposite one another as in FIG. 19, each first terminal inthe first grid 1414A of the first package 1400A is aligned with thecorresponding first terminal in the second grid 1424B of the secondpackage 1400B which has the same signal assignment and to which it iselectrically connected. Moreover, each first terminal in the second grid1424A of the first package 1400A is aligned with the corresponding firstterminal in the first grid 1414B which has the same signal assignmentand to which it is electrically connected. To be sure, the alignment ofeach pair of connected terminals is within a tolerance, such that eachpair of connected terminals can be aligned within one ball pitch of oneanother in orthogonal x and y directions along the first surface 1460 ofthe circuit panel 1464.

Thus, as further shown in FIG. 19, a particular first terminal thatcarries a signal marked “A” in grid 1414A of the first package 1400A isaligned with the corresponding first terminal of grid 1424B of thesecond package 1400B that carries the same signal “A”. The same is alsotrue regarding a particular first terminal that carries a signal marked“A” in grid 1424A of the first package 1400A that is aligned with thecorresponding first terminal of grid 1414B of the second package 1400Bthat carries the same signal “A”.

In this way, as further seen in FIG. 19, the lengths of the electricalconnections through the circuit panel between each pair of electricallyconnected first terminals of the first and second packages 1400A, 1400Bcan be significantly reduced, in that the terminals in each of thesepairs of electrically connected second terminals may overlie oneanother, or at least be aligned within one ball pitch of one another.The reductions in the lengths of these electrical connections can reducestub lengths in the circuit panel and the assembly, which can helpimprove the electrical performance, such as reducing settling time,ringing, jitter, or intersymbol interference, among others, for theabove-noted signals which are carried by the first terminals and whichare transferred to microelectronic elements in both the first and secondpackages. Moreover, it may be possible to obtain other benefits as well,such as simplifying the structure of the circuit panel or reducing thecomplexity and cost of designing or manufacturing the circuit panel.

As further shown in FIG. 19, when the second terminals of each package1400A, 1400B are arranged in third and fourth grids having the specificmirror image arrangement described above with respect to FIGS. 16-18,each second terminal of each package's first grid can be aligned withthe corresponding second terminal of the other package's second gridwhich has the same signal assignment and to which it is electricallyconnected. Thus, as seen in FIG. 19, each second terminal 1406 in thethird grid 1416A of the first package 1400A is aligned with thecorresponding second terminal in the fourth grid 1426B of the secondpackage 1400B which has the same signal assignment and to which it iselectrically connected. Moreover, each second terminal in the fourthgrid 1426A of the first package 1400A is aligned with the correspondingsecond terminal in the third grid 1416B which has the same signalassignment and to which it is electrically connected. Again, thealignment of each pair of connected terminals is within a tolerance,such that each pair of connected terminals can be aligned within oneball pitch of one another in orthogonal x and y directions along thefirst surface 1460 of the circuit panel 1464.

Thus, as further shown in FIG. 19, a particular first terminal thatcarries a signal marked “B” in grid 1416A of the first package 1400A isaligned with the corresponding first terminal of grid 1426B of thesecond package 1400B that carries the same signal “B” and to which it iselectrically connected. The same is also true regarding a particularfirst terminal that carries a signal marked “B” in grid 1426A of thefirst package 1400A that is aligned with the corresponding firstterminal of grid 1416B of the second package 1400B that carries the samesignal “B” and to which it is electrically connected.

Similar to the connections between corresponding first terminals 1404 offirst and second packages as described above, in this embodiment, thelengths of the electrical connections through the circuit panel betweenpairs of electrically connected second terminals 1406 of the first andsecond packages can be significantly reduced, in that the terminals ineach of these pairs of electrically connected second terminals mayoverlie one another, or at least be aligned within one ball pitch of oneanother in orthogonal x and y directions parallel to the circuit panelsurface. Moreover, benefits similar to those described above forreducing stub lengths and simplifying the construction of a circuitpanel for the connections between the first and second packages may beobtained when the second terminals of a microelectronic package arearranged in this way, i.e., terminals which can be assigned to carrysignals other than the above-noted signals of the command-address bus.

FIG. 20 illustrates a particular arrangement of terminals withinrespective first grids 1474, 1484, and second grids 1476, 1486 of thepackage 1480, illustrating a staggered arrangement in which terminals atthe same relative vertical position in adjacent columns 1438, 1439 ineach grid may be disposed at positions which are offset from one anotherin the vertical layout direction 1434 of the package.

FIG. 21 illustrates a particular arrangement of first terminals in firstand second parallel grids 1478, 1488 on a microelectronic package, inwhich each grid includes three adjacent columns of terminals. Asmentioned above, in some embodiments, it may be possible for signalsother than the above-noted command-address bus signals to be assigned toterminals within the same grids which also carry the above-notedcommand-address bus signals. Other arrangements may also be provided inwhich each of a pair of grids 1478, 1488 having mirror image signalassignments as described above has four columns of terminals rather thantwo or three.

In a further variation of the embodiment shown in FIGS. 16-18, it ispossible for the first terminals arranged to carry the above-notedcommand-address bus signals to be provided in first and secondindividual columns of terminals, wherein each respective individualcolumn contains a set of first terminals configured to carry all of theabove-noted command address bus signals. The first terminals can furtherbe arranged such that the signal assignments in the first and secondcolumns are a mirror image of each other, in that the signal assignmentsare symmetric about an axis extending in the same direction in which thefirst and second columns extend. In this way, the signal assignments ofthe first terminals in the first column are the same as the signalassignments of the first terminals at the same relative verticalpositions in the second column on the package.

FIG. 22 illustrates a microelectronic package 1490 according to yetanother variation in which microelectronic elements 1401, 1403 arevertically stacked assemblies of semiconductor chips. Thus, as seen inFIG. 22, one or more of the microelectronic elements 1401, 1403 caninclude a first semiconductor chip 1451 having a contact-bearing face1431 facing away from the substrate 1402, and contacts 1436 on the face1431 wire-bonded to substrate contacts on the substrate 1402 asdescribed relative to FIGS. 16-18 above. In one example, a secondsemiconductor chip 1453 of such microelectronic element can havecontacts 1455 facing corresponding contacts 1445 of the firstsemiconductor chip 1451 and be joined thereto, such as throughelectrically conductive bumps, e.g., a bond metal, as described above.

In other variations, one or more of the microelectronic elements 1401,1403 in the package 1490 can be constructed as described above withreference to FIG. 10, 11-12, 13, 14 or 15.

In yet another variation, the microelectronic structure may includethree microelectronic elements having contacts on a face thereof andoriented face down towards the second surface of the substrate, thecontacts being exposed by an aperture, e.g., bond window, in thesubstrate, as shown and described for example relative to FIGS. 8A-B,and 11 of the '515 and '565 applications or as shown and described, forexample, relative to FIGS. 9A and 15A of commonly owned U.S. applicationSer. No. 13/354,747 (“the '747 application”), the disclosure of which isincorporated herein by reference.

FIG. 23 illustrates a microelectronic structure 1500 according to avariation of the above-described embodiment of FIGS. 16-18 in whichfirst, second, third and fourth microelectronic elements 1501, 1503,1505 and 1507 are incorporated therein. The package further depicts foursets 1514, 1524, 1534, 1544 of first terminals, e.g., four gridsassigned to carry the above-noted address information and for which thesignal assignments of some sets of the first terminals are a mirrorimage of the signal assignments of other sets of the first terminals. Ina particular example, the first terminals can be assigned to carrysignals of the command-address bus. As in the above-described example,each set or grid of first terminals can be electrically connected withjust one of the microelectronic elements, or can be connected to two ormore of the microelectronic elements. FIG. 23 illustrates one possiblearrangement of the package 1500 showing the grids 1514, 1524, 1534, and1544 of first terminals and one possible arrangement of grids 1516,1526, 1536, and 1546 of second terminals.

As shown in FIG. 23, each of the microelectronic elements typically hastwo “long” parallel edges 1510, which extend in the same direction asthe direction in which the one or more columns of contacts on themicroelectronic element extend, as described above relative to FIGS. 6B,6C, 6D, and 7A. In one example, these “long” edges may each be longerthan two short parallel edges 1512 of each microelectronic element. Inanother example, these “long” edges 1510 may merely extend in the samedirection as the one or more columns of contacts, while in fact beingshorter than the “short” edges 1512 of the same microelectronic element.References to the “long” and “short” edges of microelectronic elementsin each of the packages described below incorporate these definitions.

As further seen in FIG. 23, in this particular variation, two of thegrids 1524, 1534 can be disposed close to a centerline 1530 of thepackage separating microelectronic elements 1503, 1505, while the othergrids 1514, 1544 can be disposed near peripheral edges 1550, 1552 of thepackage.

FIG. 24 is a plan view illustrating a package 1560 according to avariation of that shown in FIG. 23, in which the positions of the gridsof the first terminals on the package are varied. In this case, viewingthe differences between package 1560 and package 1500 of FIG. 23, theposition of the grid 1534 within package 1560 is exchanged with theposition of the grid 1536 of second terminals, such that the grid 1536is now disposed between the grids 1524, 1534 of the first terminals. Inaddition, the position of the grid 1544 within the package 1560 isexchanged with the position of the grid 1546 of second terminals, suchthat the grid 1546 is now disposed between the grids 1534, 1544 of thefirst terminals.

FIG. 25 is a plan view illustrating a package 1570 according to anothervariation of that shown in FIG. 23, in which the positions of the gridsof the first terminals are varied. In this case, viewing the differencesbetween package 1570 and package 1500 of FIG. 23, the position of thegrid 1524 of first terminals within the package 1570 is exchanged withthe position of the grid 1526 of second terminals, such that the grid1524 is now disposed between and adjacent to grids 1514, 1526. Inaddition, the position of the grid 1534 within the package 1570 isexchanged with the position of the grid 1536 of second terminalsrelative to that shown in FIG. 23, such that the grid 1534 is nowdisposed between and adjacent to grids 1536, 1544.

FIG. 26 is a plan view illustrating a package 1600 according to afurther variation of the above-described embodiment of FIGS. 16-18 inwhich first, second, third and fourth microelectronic elements 1601,1603, 1605, 1607 are arranged in a matrix on the substrate, wherein eachmicroelectronic element has parallel first edges 1610 which extend in afirst direction 1620, and parallel second edges 1612 which extend in asecond direction 1622 parallel to the second surface 1408 (FIG. 17) ofthe substrate and transverse to the first direction, such as orthogonalto the first direction 1620. The first edges 1610 may be “long edges”when such edges represent a dimension of a length of the respectivemicroelectronic element, and the second edges 1612 may be “short edges”when such edges represent a dimension of the respective microelectronicelement which is shorter than the length. Alternatively, the secondedges 1612 may be “long edges” when such edges represent a dimension ofa length of the respective microelectronic element, and the first edges1610 may be “short edges” when such edges represent a dimension of therespective microelectronic element which is shorter than the length.

As seen in FIG. 26, the microelectronic elements can be arranged withthe first edges 1610 of microelectronic elements 1601, 1603 adjacent andparallel to one another. The first edges 1610 of microelectronicelements 1605, 1607 can be adjacent and parallel to one another, aswell. The microelectronic elements are also arranged such that onesecond edge 1612 of microelectronic element 1601 is adjacent andparallel to the second edge 1612 of the other microelectronic element1607, and one second edge 1612 of microelectronic element 1603 isadjacent and parallel to one second edge 1612 of the othermicroelectronic element 1605. Each of the first edges 1610 ofmicroelectronic element 1601 can in some cases be collinear with thefirst edges 1610 of microelectronic element 1607. Likewise, each of thefirst edges 1610 of microelectronic element 1603 can in some cases becollinear with the first edges 1610 of microelectronic element 1605.

Grids 1651, 1653, 1655, 1657 of second terminals, which may overlieportions of respective microelectronic elements 1601, 1603, 1605, 1607and are electrically connected therewith, can have terminals disposed inany suitable arrangement, there being no requirement to place thesesecond terminals in grids in which the signal assignments in any one ofthe grids 1651, 1653, 1655, or 1657 are a mirror image of the signalassignments of the terminals in any one of the other grids 1651, 1653,1655, or 1657.

In a particular example, the signal assignments of the second terminalsin any one of the grids 1651, 1653, 1655, or 1657 can be a mirror imageof the signal assignments of the second terminals in one or two otherones of the grids 1651, 1653, 1655, or 1657, in that the signalassignments of any one of the grids can be symmetric about a verticalaxis 1680 in a vertical layout direction parallel to a first surface1602 of the microelectronic structure with respect to the signalassignments of another grid. Alternatively, or in addition thereto, thesignal assignments of any one of the grids can be symmetric about ahorizontal axis 1682 with respect to the signal assignments of anothergrid.

For example, as shown in FIG. 26, the signal assignments of grid 1651are symmetric about the vertical axis 1680 parallel to the first surface1602 of the microelectronic structure with respect to the signalassignments of the grid 1653, where the vertical axis 1680 extends in avertical layout direction 1620 which in the example shown is between thegrids 1651 and 1653. Also, the signal assignments of the grid 1651 aresymmetric about the horizontal axis 1682 with respect to the signalassignments of the grid 1657, where the horizontal axis 1682 can extendin a horizontal layout direction 1622 parallel to the first surface 1602of the microelectronic structure, which in the example shown is betweenthe grids 1651 and 1657. In an alternative arrangement, each of thegrids 1651 and 1657 may extend to portions of the substrate surface onboth sides of the horizontal axis 1682, and the relationships describedabove can otherwise be present. Similarly, such arrangement may existfor grids 1653 and 1655.

In the particular example shown in FIG. 26, the signal assignments ofthe grids 1651 and 1657 are symmetric about a first theoretical plane1680, i.e., a vertical axis with respect to the signal assignments ofthe respective grids 1653 and 1655. Also, the signal assignments of thegrids 1651 and 1653 are symmetric about the horizontal axis with respectto the signal assignments of the respective grids 1657 and 1655. Thehorizontal axis 1682 is a second theoretical plane normal to the firstsurface 1602 of the microelectronic structure. The horizontal axis istransverse to another direction parallel to the first surface of thestructure in which the first theoretical plane 1680 extends.

FIG. 27 is a plan view illustrating a microelectronic package 1700according to another variation of the above-described embodiment (FIG.23), in which the first edges 1710 of first and second microelectronicelements 1701, 1703 extend in a first direction 1720 parallel to thefirst peripheral edges 1740 of the terminal-bearing substrate surface1704, and where the second edges 1712 of microelectronic elements 1701,1703 extend in a second direction 1722 parallel to the terminal-bearingsurface 1704 of the substrate. The package 1700 further includes thirdand fourth microelectronic elements 1705, 1707. However, the first edges1730 of the third and fourth microelectronic elements 1705, 1707 extendin the second direction 1722, and the second edges 1732 of the third andfourth microelectronic elements 1705, 1707 extend in the first direction1720. As further seen in FIG. 27, first and second grids 1714, 1724 offirst terminals configured to carry the above-noted command-address bussignals, can be provided in a central region of the substrate surface,away from the substrate's first and second peripheral edges 1740, 1742where the signal assignments in the second grid 1724 are a mirror imageof the signal assignments in the first grid 1714, as described above. Inone example as shown in FIG. 27, the first and second grids 1714, 1724of first terminals may be disposed between adjacent first edges 1710 ofthe first and second microelectronic elements 1701, 1703 and may overlieportions of the third and fourth microelectronic elements 1705, 1707.Grids of second terminals 1751, 1753, 1755, 1757 may at least partiallyoverlie respective microelectronic elements 1701, 1703, 1705, 1707 towhich the second terminals therein electrically connect. As seen in FIG.27, the signal assignments of the second terminals in grid 1753 can be amirror image of the signal assignments of the second terminals in thegrid 1751. The mirror image signal assignments of terminals in grids1714, 1724, and grids 1751, 1753 may permit the above-describedreduction in stub lengths in a circuit panel to be achieved when twopackages 1700 of like configurations are mounted opposite one another onopposite surfaces of the circuit panel.

Grids 1755, 1757 of second terminals, which may overlie portions ofmicroelectronic elements 1705, 1707 and are electrically connectedtherewith, can have terminals disposed in any suitable arrangement,there being no requirement to place these second terminals in grids inwhich the signal assignments in one of the grids 1755 are a mirror imageof the signal assignments of the terminals in the other grid 1757.However, in a particular example, the signal assignments of the secondterminals in a grid 1755 can be a mirror image of the signal assignmentsof the second terminals in another grid 1757, in that the signalassignments can be symmetric about an axis 1735 extending in a direction1722 between grids 1755 and 1758. In this case, there can be symmetryabout an axis 1735 extending in the horizontal direction of FIG. 27 forthese second terminals in the grids 1755, 1757.

Moreover, such configuration can be provided in a microelectronicpackage in which symmetries in the signal assignments between the gridsof first terminals or between the other grids 1751, 1753 of secondterminals may optionally be provided. As further illustrated in FIG. 17,the terminals in the sets of terminals, e.g., grids 1755, 1757 may haveone or more of the signal class symmetry or modulo-X symmetry asdescribed above with reference to FIG. 5A.

FIG. 27 further illustrates that one or more buffer elements 1750 can beprovided as a microelectronic element disposed in a central region ofthe microelectronic structure or package 1700 between adjacent edges1730, 1710 of the first, second, third and fourth microelectronicelements 1701, 1703, 1705, and 1707. Each such buffer element can beused to provide signal isolation between terminals of the structure,particularly for the above-noted command address bus signals received atthe first terminals of the package, and one or more of themicroelectronic elements in the package. The one or more buffer elementsregenerate signals received at the first terminals, or received at thesecond terminals, and transfers the regenerated signals to one or moreof the microelectronic elements in the package.

Alternatively or in addition thereto, the area of the substrate 1702between the adjacent edges 1710, 1730 of the microelectronic elementsmay permit one or more decoupling capacitors to be provided on or in thepackage which are connected to internal power supply or ground buses ofthe package.

FIG. 28 illustrates a variation of the embodiment seen in FIG. 27, inwhich the positions of the first and second grids 1714, 1724 can bevaried so as to overlie at least portions of the first and secondmicroelectronic elements 1701, 1703. In such case, the positions of thethird and fourth microelectronic elements 1705, 1707 may also changesuch that portions of first edges 1730 of the third and fourthmicroelectronic elements 1705, 1707 may be moved away from the center ofthe package. In this case, the first edges 1730 of the third and fourthmicroelectronic elements are parallel to and are spaced apart fromportions of the second edges 1712 of the first and secondmicroelectronic elements in direction 1720. As a result, an amount ofarea 1760 at the center of the package that is available for connectionof one or more buffer elements or decoupling capacitors, or other devicemay be greater than that shown in FIG. 27. FIG. 28 also illustrates anarrangement in which the signal assignments of sets of second terminals,which may be disposed at positions within grids adjacent first andsecond edges 1736, 1738 of the substrate can exhibit symmetry about anaxis (not shown) extending in the first direction 1720 parallel to edges1736, 1738. Alternatively, or in addition thereto, the signalassignments of sets of second terminals, which may be disposed withingrids adjacent third and fourth edges 1737, 1739 of the substrate canexhibit symmetry about an axis (not shown) extending in a seconddirection 1722 transverse to the first direction 1720, e.g., which canbe parallel to the third and fourth edges 1737, 1739.

FIG. 29 illustrates a microelectronic package 1800 according to avariation of the above-described embodiment (FIG. 28). In thisvariation, the microelectronic elements 1801, 1803, 1805, 1807 arearranged in a pinwheel-like configuration in which the first edges 1810of microelectronic elements 1801, 1803 extend in the same direction 1820as the second edges 1830 of microelectronic elements 1805, 1807. Inaddition, the first edges 1830 of microelectronic elements 1805, 1807extend in the same direction 1822 as the second edges 1812 of themicroelectronic elements 1801, 1803. A portion of one of the first edges1810 of microelectronic element 1801 is spaced apart from and parallelto a portion of an adjacent second edge 1832 of microelectronic element1807. Similarly, a portion of the one of the first edges 1830 ofmicroelectronic element 1805 is spaced apart from and parallel to anadjacent second edge 1812 of microelectronic element 1801. Theserelationships can be repeated within the package for a portion of one ofthe first edges 1810 of microelectronic element 1803 and a portion ofone of the second edges 1832 of microelectronic element 1805, as well asfor a portion of one of the first edges 1830 of microelectronic element1807 and a portion of one of the second edges 1812 of microelectronicelement 1803.

In addition, it is further seen that there is a plane 1840 normal to thesubstrate which contains one of the first edges 1810 of microelectronicelement 1801, and which intersects the first edge 1830 of anothermicroelectronic element 1805. Similarly, there is a plane 1842 normal tothe substrate which contains one of the first edges 1830 ofmicroelectronic element 1805, and which intersects the first edge 1810of another microelectronic element 1803. From an inspection of FIG. 29,it can be seen that a similar plane which contains one of the firstedges of microelectronic element 1807 will intersect the first edge ofmicroelectronic element 1801 and a similar plane which contains one ofthe first edges of microelectronic element 1803 will intersect the firstedge of microelectronic element 1807. The package can be constructed sothat the planes containing a first edge of one microelectronic elementintersect a first edge of at most one other microelectronic elementwithin the package.

FIG. 29 further illustrates that the sets, e.g., grids 1814, 1824 offirst terminals having mirror image signal assignments may eachpartially or fully overlie one or more of the microelectronic elementsin the package 1800. The signal assignments within the grids containingfirst terminals and the grids containing second terminals can be asdescribed above relative to FIG. 27 or 28. In addition, a central area1850 of the substrate which is disposed between adjacent edges 1810,1832 of the microelectronic elements, and over which none of the facesof the microelectronic elements is disposed, may accommodate one or morebuffer elements or decoupling capacitors or both as described aboverelative to FIGS. 27-28.

FIG. 30 illustrates a microelectronic package according to a variationof the microelectronic package 1570 described above with respect to FIG.25 which includes three microelectronic elements 1901A, 1902B, and 1902Cspaced apart from one another on the substrate 1902 instead of fourmicroelectronic elements. As the case with the first and second grids1514, 1524, and the third and fourth grids 1534, 1544 in the embodimentseen in FIG. 25, the signal assignments of the first terminals in thefirst grid 1914 of the package 1900 can be a mirror image of the signalassignments of the first terminals in the second grid 1924. Moreover,the same can also be true of the signal assignments of the firstterminals in a third grid 1934 of the package 1900, which can be amirror image of the signal assignments of the first terminals in afourth grid 1944. In addition, as seen in FIG. 30, in a particularexample, the first grid 1914 may overlie the first microelectronicelement 1901A, while the second grid 1924 may overlie the secondmicroelectronic element 1901B. As further seen in FIG. 30, the thirdgrid 1934 may overlie the third microelectronic element 1901C. Thefourth grid 1944 may overlie a portion of a surface of the substrate1902 beyond an edge 1942 of the third microelectronic element 1901C, asseen in FIG. 30. Alternatively, although not shown, the fourth grid 1944may also overlie the third microelectronic element 1901C.

Each of the examples illustrated and discussed with reference to FIGS.23-30 above can be implemented with microelectronic elements thereinhaving contacts on faces thereof which either face in the same directionwhich the first surface of the microelectronic structure faces, or canface away from the direction in which the first surface of themicroelectronic structure faces. Thus, in particular examples, themicroelectronic structures may be as shown and described in the examplesof any of FIGS. 13-20 of commonly owned U.S. application Ser. No.13/439,317, the disclosure of which is incorporated by reference herein.

Although the examples described in FIG. 23-30 refer to themicroelectronic elements overlying a substrate, the substrate may beomitted in an appropriate case, as when the microelectronic elements arearranged together within a molded unit, e.g., a wafer-level unit, inwhich a dielectric layer may be formed on or above contact-bearing facesof the microelectronic elements for supporting traces and electricalinterconnections thereon.

In other examples, microelectronic structures having multiple stackedmicroelectronic elements therein may be single or multiple stackimplementations as shown and/or described with reference to FIGS. 21-25of commonly owned U.S. application Ser. No. 13/439,317, the disclosureof which is incorporated by reference herein.

In still other examples, microelectronic structures having fourmicroelectronic elements therein may be as shown and described in FIGS.9A-B, 9C, 9D, 9F, 9G, 9H, 12B, 12C or 12D of the '515 or '565applications, or may be as shown and described in FIGS. 7A-B, 8, 11A,11B, 11C, 11D, 12, 13B, 14B, or 14C of the '747 application.

The microelectronic packages and microelectronic assemblies describedabove with reference to FIGS. 5 through 30 above can be utilized inconstruction of diverse electronic systems, such as the system 2500shown in FIG. 31. For example, the system 2500 in accordance with afurther embodiment of the invention includes a plurality of modules orcomponents 2506 such as the microelectronic packages and/ormicroelectronic assemblies as described above in conjunction with otherelectronic components 2508, 2510 and 2511.

In the exemplary system 2500 shown, the system can include a circuitpanel, motherboard, or riser panel 2502 such as a flexible printedcircuit board, and the circuit panel can include numerous conductors2504, of which only one is depicted in FIG. 31, interconnecting themodules or components 2506, 2508, 2510 with one another. Such a circuitpanel 2502 can transport signals to and from each of the microelectronicpackages and/or microelectronic assemblies included in the system 2500.However, this is merely exemplary; any suitable structure for makingelectrical connections between the modules or components 2506 can beused.

In a particular embodiment, the system 2500 can also include a processorsuch as the semiconductor chip 2508, such that each module or component2506 can be configured to transfer a number N of data bits in parallelin a clock cycle, and the processor can be configured to transfer anumber M of data bits in parallel in a clock cycle, M being greater thanor equal to N.

In one example, the system 2500 can include a processor chip 2508 thatis configured to transfer thirty-two data bits in parallel in a clockcycle, and the system can also include four modules 2506 such as themicroelectronic package 100 described with reference to FIGS. 5A-5C,each module 2506 configured to transfer eight data bits in parallel in aclock cycle (i.e., each module 2506 can include first and secondmicroelectronic elements, each of the two microelectronic elements beingconfigured to transfer four data bits in parallel in a clock cycle).

In another example, the system 2500 can include a processor chip 2508that is configured to transfer sixty-four data bits in parallel in aclock cycle, and the system can also include four modules 2506 such asthe microelectronic package described with reference to any one of FIGS.23-29, each module 2506 configured to transfer sixteen data bits inparallel in a clock cycle (i.e., each module 2506 can include fourmicroelectronic elements, each of the four microelectronic elementsbeing configured to transfer four data bits in parallel in a clockcycle).

In the example depicted in FIG. 31, the component 2508 is asemiconductor chip and component 2510 is a display screen, but any othercomponents can be used in the system 2500. Of course, although only twoadditional components 2508 and 2511 are depicted in FIG. 31 for clarityof illustration, the system 2500 can include any number of suchcomponents.

Modules or components 2506 and components 2508 and 2511 can be mountedin a common housing 2501, schematically depicted in broken lines, andcan be electrically interconnected with one another as necessary to formthe desired circuit. The housing 2501 is depicted as a portable housingof the type usable, for example, in a cellular telephone or personaldigital assistant, and screen 2510 can be exposed at the surface of thehousing. In embodiments where a structure 2506 includes alight-sensitive element such as an imaging chip, a lens 2511 or otheroptical device also can be provided for routing light to the structure.Again, the simplified system shown in FIG. 31 is merely exemplary; othersystems, including systems commonly regarded as fixed structures, suchas desktop computers, routers and the like can be made using thestructures discussed above.

Various features of the above-described embodiments of the invention canbe combined in ways other than as specifically described above withoutdeparting from the scope or spirit of the invention. It is intended forthe present disclosure to cover all such combinations and variations ofembodiments of the invention described above.

1. A microelectronic structure, comprising: active elements defining amemory storage array; and address inputs for receipt of addressinformation specifying locations within the storage array, the structurehaving a first surface and terminals exposed at the first surface, theterminals including first terminals and the structure being configuredto provide address information received at the first terminals to theaddress inputs, each of at least some of the first terminals having asignal assignment including information to be transferred to one or moreof the address inputs, the first terminals disposed on first and secondopposite sides of a theoretical plane normal to the first surface,wherein signal assignments of the first terminals disposed on the firstside are symmetric about the theoretical plane with the signalassignments of the first terminals disposed on the second side.
 2. Themicroelectronic structure of claim 1, wherein the signal assignment ofeach first terminal on the first side is a mirror image of the signalassignment of each first terminal on the second side.
 3. Themicroelectronic structure of claim 1, wherein each of the first andsecond sets of first terminals is configured to carry addressinformation sufficient to specify a location within the memory storagearray, and the microelectronic structure further includes a plurality ofno-connect terminals exposed at the first surface, wherein the positionof each first terminal on the first side is symmetric about thetheoretical plane with a position of a no-connect terminal on the secondside, and the position of each first terminal on the second side issymmetric about the theoretical plane with a position of a no-connectterminal on the first side.
 4. The microelectronic structure of claim 1,wherein the first terminals on each of the first and second sides areconfigured to receive the address information necessary to uniquelyspecify a single storage location within the storage array.
 5. Themicroelectronic structure of claim 1, wherein the first terminals oneach of the first and second sides are configured to receive a majorityof the address information necessary to uniquely specify a singlestorage location within the storage array.
 6. The microelectronicstructure of claim 1, wherein the terminals are configured toelectrically connect the microelectronic structure to correspondingcontacts of a circuit panel.
 7. The microelectronic structure of claim1, further comprising a serial presence detect (SPD) element configuredto nonvolatilely store one or more operational parameters relating tothe storage array.
 8. The microelectronic structure of claim 1, whereinthe first surface of the microelectronic structure faces a firstdirection, and the structure includes one or more semiconductor chips,the address inputs exposed at a surface of at least one of the one ormore semiconductor chips, the structure further including a substratehaving a first surface facing the first direction, and a second surfacefacing a direction opposite the first direction, wherein the one or moresemiconductor chips overlies at least one of the first or secondsurfaces of the substrate.
 9. The microelectronic structure of claim 8,further comprising serial presence detect (SPD) element configured tononvolatilely store one or more of a serial number, or defectivelocations of the storage array.
 10. The microelectronic structure ofclaim 8, wherein the first surface of the microelectronic structurefaces a first direction, and the structure includes a substrate having afirst surface facing in the first direction and a second surface facingin a direction opposite the first direction, wherein at least one of theone or more semiconductor chips overlies the first surface of thesubstrate.
 11. The microelectronic structure of claim 1, wherein thetheoretical plane is a first theoretical plane intersecting the firstsurface along a line extending in a first direction, wherein theterminals include a plurality of second terminals disposed on first andsecond opposite sides of a second theoretical plane normal to the firstsurface and intersecting the first surface along a second line in asecond direction transverse to the first direction, wherein signalassignments of the second terminals disposed on the first side of thesecond theoretical plane are a mirror image of the signal assignments ofthe second terminals disposed on the second side of the secondtheoretical plane.
 12. The microelectronic structure of claim 1, furthercomprising a buffer element having a plurality of second activeelements, wherein the buffer element is configured to at least one ofregenerate, partially or fully decode the address information fortransfer to the at least some address inputs.
 13. The microelectronicstructure of claim 1, wherein the storage array is incorporated in oneor more of a plurality of vertically stacked semiconductor chips atleast partially overlying one another.
 14. The microelectronic structureof claim 13, wherein the microelectronic structure includes a substratehaving a first surface, the first surfaces of the substrate and themicroelectronic structure facing in a first direction, wherein theplurality of vertically stacked semiconductor chips overlie a secondsurface of the substrate facing in a second direction opposite the firstdirection.
 15. The microelectronic structure of claim 1, wherein themicroelectronic structure includes first and second semiconductor chips,each semiconductor chip having a face disposed in a single planeparallel to the first surface, wherein at least some of the addressinputs are exposed at the face of the first semiconductor chip and atleast some of the address inputs are exposed at the face of the secondsemiconductor chip.
 16. The microelectronic structure of claim 11,wherein the microelectronic structure includes one or more semiconductorchips and includes a dielectric layer having a surface overlying a faceof at least one of the one or more semiconductor chips, the surface ofthe dielectric layer facing away from the face of the one or moresemiconductor chips, the structure including traces extending along thedielectric layer and metallized vias extending from the traces andelectrically connected with address inputs exposed at a surface of theat least one semiconductor chip, wherein the structure is configured tocouple address information received on the terminals to the addressinputs through the traces and the metallized vias.
 17. Themicroelectronic structure of claim 1, wherein the memory storage arrayincludes first and second memory storage arrays, the microelectronicstructure being configured to provide address information received onthe first terminals on the first side to the first memory storage arrayand to provide address information received on the first terminals onthe second side to the second memory storage array to provide dual rankmemory access.
 18. The microelectronic structure of claim 1, wherein themicroelectronic structure is configured to provide single rank memoryaccess.
 19. A microelectronic assembly, comprising: a circuit panelhaving first and second oppositely facing surfaces and first and secondpanel contacts at the first and second surfaces, respectively; and firstand second microelectronic structures having terminals mounted to thefirst panel contacts and the second panel contacts, respectively, eachmicroelectronic structure including: active elements defining a memorystorage array; and address inputs for receipt of address informationspecifying locations within the storage array, the structure having afirst surface and terminals exposed at the first surface, the terminalsincluding first terminals and the structure being configured to transferaddress information received at the first terminals to the addressinputs, each of at least some of the first terminals having a signalassignment including information to be transferred to one or more of theaddress inputs, the first terminals disposed on first and secondopposite sides of a theoretical plane normal to the first surface,wherein signal assignments of the first terminals disposed on the firstside are symmetric about the theoretical plane with the signalassignments of the first terminals disposed on the second side.
 20. Themicroelectronic assembly of claim 19, wherein each microelectronicstructure includes one or more semiconductor chips and the memorystorage array of each microelectronic structure is incorporated in atleast one of the one or more semiconductor chips thereof, wherein thefirst terminals of each microelectronic structure include terminalsconfigured to carry information that controls an operating mode of theat least one semiconductor chip of the respective microelectronicstructure.